Advanced Packaging Technology for MEMS Devices

A special issue of Micromachines (ISSN 2072-666X). This special issue belongs to the section "D1: Semiconductor Devices".

Deadline for manuscript submissions: 30 June 2025 | Viewed by 855

Special Issue Editor


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Guest Editor
Business Unit MEMS Applications, Fraunhofer Institute for Silicon Technology ISIT, Fraunhoferstraße 1, 25524 Itzehoe, Germany
Interests: laser material processing; MEMS LIDAR systems; glass packages for wafer-level packaging
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Special Issue Information

Dear Colleagues,

Advanced packaging technology for MEMS devices is crucial for their successful commercialization and performance. Advanced packaging is important for MEMS devices because it ensures the reliability and longevity of these devices. Moreover, the growing advanced packaging technology also enables increasing system integration and sensor fusion. Under advanced packaging, several technology clusters are developing simultaneously. Wafer-level-packaging (WLP) integrates the MEMS device and packaging at the wafer level, allowing the highest integration grade and cost efficiency. In addition, more and more new chip-level packaging technologies and materials have been investigated and drawing attention for advanced packaging technologies, which allows higher system flexibility. The various technology clusters are gaining increasing importance in modern electronics and sensor applications.

Prof. Dr. Shanshan Gu-Stoppel
Guest Editor

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Keywords

  • advanced packaging
  • wafer-level packaging
  • wafer bonding
  • heterogene packaging
  • chiplet
  • 3D integration
  • sensor fusion
  • smart sensor system

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Published Papers (1 paper)

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Research

18 pages, 5207 KiB  
Article
Misalignment in Mechanical Interlocking Heterogeneous Integration: Emergent Behavior and Geometry Optimization
by Matthew Nakamura, Corrisa Heyes, Ethan Rocheville, Kirsten Peterson and Joseph J. Brown
Micromachines 2025, 16(3), 305; https://doi.org/10.3390/mi16030305 - 4 Mar 2025
Viewed by 605
Abstract
This paper addresses the challenge of misalignment in cantilever-based mechanical interlocking structures used for the heterogeneous integration of integrated circuits (ICs). As IC applications expand into flexible and multi-functional platforms, precise alignment becomes critical to maintaining optimal mechanical and electrical performance. We investigate [...] Read more.
This paper addresses the challenge of misalignment in cantilever-based mechanical interlocking structures used for the heterogeneous integration of integrated circuits (ICs). As IC applications expand into flexible and multi-functional platforms, precise alignment becomes critical to maintaining optimal mechanical and electrical performance. We investigate the effects of X and Y misalignment on snap-through forces in cantilever arrays, focusing on their impact on mechanical integrity. The experimental results demonstrate that for X-axis misalignments below 15%, the increase in the required snap-through force is less than 5%. In contrast, Y-axis misalignment shows an even more negligible impact, with less than a 5% reduction in force for up to 20% misalignment. Additionally, through polynomial fits of the model across a range of cantilever angles, this study provides a design template for future exploration of cantilever interactions using nonlinear mechanics while minimizing computational load. These findings offer valuable insights for optimizing misalignment tolerance and improving the design of interlocking structures for IC integration, contributing to the development of robust systems for next-generation IC devices. Full article
(This article belongs to the Special Issue Advanced Packaging Technology for MEMS Devices)
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