Metrology is an international, peer-reviewed, open access journal on the science and technology of measurement and metrology, published quarterly online by MDPI.
  • Open Access— free for readers, with article processing charges (APC) paid by authors or their institutions.
  • Rapid Publication: first decisions in 16 days; acceptance to publication in 5.8 days (median values for MDPI journals in the second half of 2022).
  • Recognition of Reviewers: APC discount vouchers, optional signed peer review, and reviewer names published annually in the journal.
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Topic in Automation, Fibers, Metrology, Photonics, Sensors
Advance and Applications of Fiber Optic Measurement Topic Editors: Flavio Esposito, Stefania Campopiano, Agostino Iadicicco
Deadline: 31 March 2023
Topic in Applied Sciences, Metrology, Sensors, Photonics, Machines
Manufacturing Metrology Topic Editors: Fang Cheng, Qian Wang, Tegoeh Tjahjowidodo, Ziran Chen
Deadline: 31 May 2023
Topic in Applied Sciences, JMMP, Materials, Metrology, Sensors, Standards
Measurement Strategies and Standardization in Manufacturing Topic Editors: Manuel Rodríguez-Martín, João Ribeiro, Roberto García Martín
Deadline: 20 December 2024
Special Issue in Metrology
Women’s Special Issue Series: Metrology Guest Editors: Annalisa Liccardo, Samanta Piano
Deadline: 31 March 2023
Special Issue in Metrology
Developments in 3D Metrology Selected from the 3D Metrology Conference 2022 Guest Editors: Stuart Robson, Robert Schmitt, Stephen Kyle, Ben Hughes
Deadline: 15 May 2023
Special Issue in Metrology
Next Level Surface Metrology—towards Photonic Metrology and Surface Processing Guest Editors: Steve Vanlanduit, Stuart T. Smith, Christopher Taudt
Deadline: 15 June 2023
Special Issue in Metrology
Power and Electronic Measurement Systems Guest Editors: Pedro M. Ramos, Bogdan-Adrian Enache
Deadline: 25 July 2023
Topical Collection in Metrology
Measurement Uncertainty Collection Editor: Simona Salicone
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