Next-Level Surface Metrology—Advances in Sensors, Data Analysis and Simulation

A special issue of Metrology (ISSN 2673-8244).

Deadline for manuscript submissions: 25 January 2025 | Viewed by 3614

Special Issue Editors


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Guest Editor
InViLab Research Group, Faculty of Applied Engineering, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium
Interests: optical measurement techniques; metrology; laser Doppler vibrometry; optical fiber sensors; computer vision; machine vision; digital image correlation; non-destructive testing
Special Issues, Collections and Topics in MDPI journals

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Guest Editor
Center for Precision Metrology & Department of Physics and Optical Science, University of North Carolina, Charlotte, NC 28223, USA
Interests: integration of multi-sensing methods into precision electromechanical systems for nanometer and micrometer level assembly; X-ray surface measurement and micro CT metrology; dimensional metrology; the creation of new instrumentation capabilities

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Guest Editor
1. Leupold-Institute for Applied Natural Sciences (LIAN)/Optical Technologies, University of Applied Sciences Zwickau (UAS Zwickau), 08056 Zwickau, Germany
2. Application Center for Optical Metrology and Surface Technologies, Fraunhofer IWS, Fraunhofer-Institute for Material and Beam Technology, 01277 Dresden, Germany
Interests: cross-linking characterization; white-light interferometry; dispersion enhanced low-coherence interferometry; photoresist; semiconductor manufacturing; optical metrology; photonics; optics; imaging; image processing; data analysis; signal processing

Special Issue Information

Dear Colleagues,

Advancements in surface processing lead to novel and interesting problems in the research and development of processes accompanying metrology. In a variety of fields, such as novel sensing approaches, intelligent data-processing techniques, and model-based manufacturing schemes, progress in research drives novel applications in industry. Large achievements are to be expected by leveraging the potential of the combined, closed-loop operation of surface processing and (optical) metrology.

The aim of this Special Issue is to open discussion and technical routes for further developments in this topic across the disciplines of physicists, laser engineers, data-processing experts, and system theorists. Submissions can demonstrate novel metrology and sensing techniques for surface analysis, develop and evaluate novel data analysis approaches to enhance metrology or allow gains by sensor fusion, and be research on model-based, generalized surface processing approaches.

Please submit your manuscripts related, but not limited, to the following areas:

  • Low-coherence interferometric metrology techniques (incl. OCT and others).
  • Microscopy and coherent techniques (e.g., speckle interferometry).
  • High-dynamic-range, low-SNR, and high-resolution techniques.
  • Advanced imaging techniques (hyperspectral imaging, scattering techniques, appearance imaging, etc.).
  • Computational imaging technologies (ghost imaging, compressed sensing, etc.).
  • From lab to sensor (technologies for sensor fusion, autonomous calibration, and sensing as well as multi-domain sensing).
  • Optical metrology-related data-processing approaches (AI, sparse data, fingerprint techniques, and others).
  • Novel approaches to photonic surface processing and functionalization (sub-diffraction limit, random pattern processing, direct laser interference patterning, holographic lithography, photonic jet, etc.).
  • Modeling and generalization of surface processing approaches, surface functionality, and its metrology.
  • Closed-loop system description, design, calibration, and/or evaluation (combination of metrology and surface processing tools) in the context of photonic surface processing and characterization.

Prof. Dr. Steve Vanlanduit
Prof. Dr. Stuart T. Smith
Dr. Christopher Taudt
Guest Editors

Manuscript Submission Information

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Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Metrology is an international peer-reviewed open access quarterly journal published by MDPI.

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Published Papers (3 papers)

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Research

23 pages, 3064 KiB  
Article
SurfILE: An Open-Source Python Package for Surface Topography Analysis
by Andrea Giura, Massimo Zucco and Luigi Ribotta
Metrology 2024, 4(4), 695-717; https://doi.org/10.3390/metrology4040041 - 2 Dec 2024
Viewed by 364
Abstract
Surface metrology deals with inspecting surfaces and profiles by using contact or non-contact profilometers. In this field, the characterization of the dimensional, morphological, and texture parameters of samples as well as the assessment of metrological characteristics of measuring instruments are key issues. Manufacturers [...] Read more.
Surface metrology deals with inspecting surfaces and profiles by using contact or non-contact profilometers. In this field, the characterization of the dimensional, morphological, and texture parameters of samples as well as the assessment of metrological characteristics of measuring instruments are key issues. Manufacturers of instruments provide commercial software tools to analyze topography data. There are also freely available tools, including open-source options, that provide a variety of algorithms and methods. The rapid growth of investigations aimed at better understanding the effects of the microscale phenomena requires the improved traceable calibration of samples, the development of new methodologies and measuring techniques, and the specification of new mathematical models and processing techniques. In this work, we present SurfILE, the launch of an open-source Python project that provides various procedures and algorithms for topography analysis. The open-source software presented in this article is intended to be modular, expandable, and customizable. Full article
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12 pages, 5261 KiB  
Article
Practical Approaches for Determining the Structural Resolution Capability of X-ray Computed Tomography Measurement Tasks
by Matthias Busch and Tino Hausotte
Metrology 2024, 4(3), 457-468; https://doi.org/10.3390/metrology4030028 - 12 Sep 2024
Viewed by 674
Abstract
The structural resolution describes the ability of a measuring device to detect small structures on the surface of a component or test specimen by means of a quantitative value. However, the structural resolution in the computer tomograph depends on the object and must [...] Read more.
The structural resolution describes the ability of a measuring device to detect small structures on the surface of a component or test specimen by means of a quantitative value. However, the structural resolution in the computer tomograph depends on the object and must therefore be determined separately for each measurement task. The previous approaches to structural resolution determination are only related to test specimens. In this paper, less discrete approaches based on a circular pattern are presented, which can be integrated into the measured component. A voxel-based methodology as well as two surface-based methodologies are described. The investigation results regarding the effect of the component position on the structural resolution are obtained on the basis of real CT measurements. A comparison is also completed with the well-known hourglass method. The results show that the resolution depends on the object being measured, with similar values being obtained for the same object using different methods. Full article
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16 pages, 10314 KiB  
Article
Foam Pressure Mapping with Optimized Electrodes
by Jake Sundet, Jake Merrell, Maxwell Tree, Trevor Christensen and Stephen Schultz
Metrology 2024, 4(1), 82-97; https://doi.org/10.3390/metrology4010006 - 7 Feb 2024
Viewed by 1249
Abstract
Nano-composite piezo-responsive foam (NCPF) is an inexpensive foam that can be used to measure a static load while still providing a comfortable interface. The purpose of this study was to create a modularized foam-based pressure measurement system. A measurement system was developed that [...] Read more.
Nano-composite piezo-responsive foam (NCPF) is an inexpensive foam that can be used to measure a static load while still providing a comfortable interface. The purpose of this study was to create a modularized foam-based pressure measurement system. A measurement system was developed that uses an interdigitated electrode applied to the NCPF. Applied pressure changes the impedance of the NCPF, which, in turn, is converted into a voltage using a voltage divider. A modular measurement system is described that uses an ATtiny 1627 microcontroller to measure the pressure at nine electrodes. The nine electrode modules are controlled by an ESP32 microcontroller that aggregates the data and wirelessly transmits the data to a tablet. The modular system was demonstrated with 1008 individual electrodes. The characterization of the electrode combined with the NCPF is presented, along with optimization of the electrode geometry. Full article
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