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Computed Tomography and X-ray Imaging in Material Science

A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Materials Characterization".

Deadline for manuscript submissions: 20 June 2024 | Viewed by 667

Special Issue Editors


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Guest Editor
School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China
Interests: radiation detection; X-ray; X-ray images; scintillators

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Guest Editor
School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China
Interests: radiation detection; X-ray; X-ray images; scintillators

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Guest Editor Assistant
Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang 621050, China
Interests: radiation detection; X-ray; X-ray images; ICF

Special Issue Information

Dear Colleagues,

As a penetrating high-energy ray, X-ray plays a crucial role in the fields of biomedicine, non-destructive industrial exploration, safety detection and high-energy physics, being applied to computed tomography technology in disease diagnosis. In addition, the femto second frame rate of free electron lasers makes it possible to study electronic processes. The quality of X-ray imaging is closely related to scintillators, which can convert high-energy radiation into ultraviolet light.

In order to ensure that X-ray imaging is more able to benefit mankind, numerous researchers are committed to developing flexible, low-dose, high-spatial and temporal resolution scintillator materials.

This Special Issue is devoted to research addressing the influence of different scintillation materials on X-ray imaging quality, including simulation calculation, the preparation and characterization of new scintillation materials, and the development of novel imaging systems.

In order to further advance this field together, researchers are invited to share their results in this Special Issue and jointly promote the development of X-ray imaging.

Dr. Qianli Li
Dr. He Feng
Guest Editors
Dr. Kuan Ren
Guest Editor Assistant

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Materials is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • radiation detection
  • radiation-induced luminescence
  • radiographic imaging
  • X-ray imaging
  • X-ray-excited luminescence
  • scintillators
  • nanomaterials
  • perovskite
  • Geant4
  • data acquisition system

Published Papers (1 paper)

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Research

14 pages, 3333 KiB  
Article
Spectrally Tunable Lead-Free Perovskite Rb2ZrCl6:Te for Information Encryption and X-ray Imaging
by Guoxue Pan, Mingqing Li, Xiaotong Yu, Yuanhao Zhou, Minghui Xu, Xinxin Yang, Zhan Xu, Qianli Li and He Feng
Materials 2024, 17(11), 2530; https://doi.org/10.3390/ma17112530 - 24 May 2024
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Abstract
A series of lead-free Rb2ZrCl6:xTe4+ (x = 0%, 0.1%, 0.5%, 1.0%, 2.0%, 3.0%, 5.0%, 10.0%) perovskite materials were synthesized through a hydrothermal method in this work. The substitution of Te4+ for Zr in Rb [...] Read more.
A series of lead-free Rb2ZrCl6:xTe4+ (x = 0%, 0.1%, 0.5%, 1.0%, 2.0%, 3.0%, 5.0%, 10.0%) perovskite materials were synthesized through a hydrothermal method in this work. The substitution of Te4+ for Zr in Rb2ZrCl6 was investigated to examine the effect of Te4+ doping on the spectral properties of Rb2ZrCl6 and its potential applications. The incorporation of Te4+ induced yellow emission of triplet self-trapped emission (STE). Different luminescence wavelengths were regulated by Te4+ concentration and excitation wavelength, and under a low concentration of Te4+ doping (x ≤ 0.1%), different types of host STE emission and Te4+ triplet state emission could be achieved through various excitation energies. These luminescent properties made it suitable for applications in information encryption. When Te4+ was doped at high concentrations (x ≥ 1%), yellow triplet state emission of Te4+ predominated, resulting in intense yellow emission, which stemmed from strong exciton binding energy and intense electron-phonon coupling. In addition, a Rb2ZrCl6:2%Te4+@RTV scintillating film was fabricated and a spatial resolution of 3.7 lp/mm was achieved, demonstrating the potential applications of Rb2ZrCl6:xTe4+ in nondestructive detection and bioimaging. Full article
(This article belongs to the Special Issue Computed Tomography and X-ray Imaging in Material Science)
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