Advanced Diffraction Techniques (X-ray, Electron, Neutron) in Materials Science
A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Materials Characterization".
Deadline for manuscript submissions: closed (20 July 2023) | Viewed by 174
Special Issue Editor
Special Issue Information
Dear Colleagues,
Leading with the rapidly advanced techniques in neutron, synchrotron and electron diffraction, materials-probing techniques have gone through many developments that contribute to fruitful new discoveries in material science. Higher-power beams, larger-area detectors, better resolution in situ characterization capabilities, developments in multi-extreme sample environments and other advances in the diffraction instruments have allowed for a more in-depth probing of crystal and magnetic structures, including in disordered materials, nanostructure systems, macromolecular systems, heterostruture systems, spacial-resolved and timely-resolved changes in structures under various sample environments, including extreme conditions. This Special Issue is focused on the advances in advanced diffraction techniques (X-ray, electron, neutron) in materials science, to recognize the achievements in this field. Here are some suggested categories for this Special Issue:
- Instrument and methods developing in diffraction
- Neutron diffraction
- Synchrotron diffraction
- Electron diffraction
- Diffraction study in materials systems
- Films, surface interactions
- Spacial-resolved and timely-resolved measurements
- Nanostructure materials, complex structure and disordered materials
- Diffuse scattering
- Materials under extremes
- Macromolecular systems
Dr. Yan Wu
Guest Editor
Manuscript Submission Information
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Keywords
- neutron diffraction
- synchrotron diffraction
- electron diffraction
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