Recent Advances on X-ray Structure Determination and Refinement Procedures
A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Materials Characterization".
Deadline for manuscript submissions: closed (31 December 2023) | Viewed by 1195
Special Issue Editor
Interests: crystallography; physical chemistry; chemical physics; quantum chemistry; computational chemistry
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
In the year 2023, the 110th Anniversary of the first ever structure determination made by using an X-ray diffraction technique, a goal reached by sir William Henry Bragg (1862-1942) y sir William Lawrence Bragg (1890-1971), father and son respectively, is celebrated. Both the experimental advances represented by the X-ray tubes designed by William David Coolidge (1873-1975) and the theoretical relationships between structure factors and atomic coordinates obtained by Arnold Johannes Wilhelm Sommerfeld (1868-1951), obtained both the very same year, were essential in order to accomplish this final objective. Since then, an astronomical number of collaborative efforts between theoreticians and experimentalists, basic and applied physics and chemistry researchers, as well as materials science and biochemical applications, just to mention a few instances, have increased the world of knowledge broadly known today as the multidisciplinary discipline of Crystallography, not to forget the brand newest field of Quantum Crystallography.
The main purpose of the current Special Issue is to present the widest and deepest possible view of the current research on X-ray structure determination and refinement procedures, including both single crystal and powder diffraction methodologies, either conventional or synchrotron, as well as computational methods and software development. Papers related to research applied to any aspect of the Materials Science area in its broadest sense are particularly well suited for this special issue.
Consequently, it is my real pleasure to invite you to submit a manuscript to this Special Issue for consideration and peer review. Full papers, short communications, and topic reviews are all welcome.
Prof. Dr. Juan F. Van der Maelen
Guest Editor
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Materials is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- crystallography
- single-crystal X-ray diffraction
- powder X-ray diffraction
- synchrotron radiation
- structure refinement
- quantum crystallography
