Special Issue "Electromagnetism in Electronics, Modern Engineering and Medical Applications"

A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Microwave and Wireless Communications".

Deadline for manuscript submissions: 30 September 2021.

Special Issue Editors

Assoc. Prof. Dr. Ewa Korzeniewska
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Guest Editor
Vice-president of Polish Society of Applied Electromagnetism; Faculty of Electrical, Electronic, Computer and Control Engineering, Lodz University of Technology, Stefanowskiego 18/22, 90-924 Łódź, Poland
Interests: materials science; textronics; wearable electronics; thin films; electromagnetic field applications; electrical engineering systems
Special Issues and Collections in MDPI journals
Dr. Mariusz Tomczyk
Website
Guest Editor
Faculty of Electrical, Electronic, Computer and Control Engineering, Lodz University of Technology, Stefanowskiego 18/22, 90-924 Łódź, Poland
Interests: laser technologies; materials science; wearable electronics; electromagnetic field applications; electrical engineering systems

Special Issue Information

Dear Colleagues,

This Special Issue is based on the activity of the group of scholars dealing with the applications of electromagnetism in electronic and electrical engineering, medicine, computational electromagnetism, modeling and simulation, measurements and industrial/medical tomography. The research activity is institutionally under the care of the Polish Society of Applied Electromagnetism (www.ptze.pl).

This Special Issue will be devoted to the applications of new solutions and computational methods in the following areas:

  • Applications of electromagnetism in electronics
  • Applications of electromagnetism in engineering
  • Applications of electromagnetism in medicine
  • Applications of electromagnetism in computer science
  • Bioelectromagnetism and environmental protection
  • Computational electromagnetism;
  • Wearable electronics
  • Textronics;
  • Electromagnetic materials
  • Medical and industrial applications of tomography
  • Electromagnetism in education and social policy
  • Tomography

There are no page limitations for this journal.

Assoc. Prof. Dr. Ewa Korzeniewska
Dr. Mariusz Tomczyk
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All papers will be peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Electronics is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1800 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • Electromagnetism
  • Bioelectromagnetism
  • Sensors
  • Numerical calculation
  • Machine learning
  • Computational intelligence
  • Coupled systems
  • Tomography
  • Wearable electronics
  • Textronics

Published Papers (3 papers)

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Research

Open AccessArticle
D-Dot Sensor Response Improvement in the Evaluation of High-Power Microwave Pulses
Electronics 2021, 10(2), 123; https://doi.org/10.3390/electronics10020123 - 08 Jan 2021
Viewed by 246
Abstract
This article investigates the issue of measuring high-power microwave (HPM) pulses. The high energy of these pulses poses a significant threat to many electronic systems, including those used to manage critical infrastructure. This work focuses on requirements for a potential portable measurement device [...] Read more.
This article investigates the issue of measuring high-power microwave (HPM) pulses. The high energy of these pulses poses a significant threat to many electronic systems, including those used to manage critical infrastructure. This work focuses on requirements for a potential portable measurement device and suggests the application of a method for this purpose, involving the use of a D-dot sensor and a rapid A/D converter. The applied converter enables recording the time waveform on the measuring chain output, also in the case of repetition and time duration of HPM signals. The authors also present a quantitative description of signal processing by the analogue section of the measurement chain solution presented herein and suggest algorithms for digital processing of the signals, the objective of which is to minimize low-frequency interference in the process of reconstructing the time waveform of an electric field using numerical integration. Full article
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Open AccessArticle
Optimization of the Ablative Laser Cutting of Shadow Mask for Organic FET Electrode Fabrication
Electronics 2020, 9(12), 2184; https://doi.org/10.3390/electronics9122184 - 18 Dec 2020
Viewed by 353
Abstract
This article presents an ablative method of cutting masks from ultra-thin metal foils using nanosecond laser pulses. As a source of laser radiation, a pulsed fiber laser with a wavelength of 1062 nm with the duration of pulses from 15 to 220 nanoseconds [...] Read more.
This article presents an ablative method of cutting masks from ultra-thin metal foils using nanosecond laser pulses. As a source of laser radiation, a pulsed fiber laser with a wavelength of 1062 nm with the duration of pulses from 15 to 220 nanoseconds (ns), was used in the research. The masks were made of stainless-steel foil with thicknesses of 30 µm, 35 µm, and 120 µm. Channels of different lengths from 50 to 300 µm were tested. The possibilities and limitations of the presented method are described. The optimization of the cutting process parameters was performed using the experiment planning techniques. A static, determined complete two-level plan (SP/DC 24) was used. On the basis of the analysis of the test structures, we designed and produced precise shading masks used in the process of organic field effect transistor (OFET) electrode evaporation. The ablative method proved suitable to produce masks with canals of minimum lengths of 70 µm. It offers facile, fast, and economically viable shadow mask fabrication for organic electronics applications, which moreover might enable fast prototyping and circuit design. Full article
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Open AccessFeature PaperArticle
Influence of Structural Defects on the Resistivity and Current Flow Field in Conductive Thin Layers
Electronics 2020, 9(12), 2164; https://doi.org/10.3390/electronics9122164 - 17 Dec 2020
Viewed by 270
Abstract
The paper presents an analysis of the influence of microcracks in textronic conductive layers on their conductive properties. The tested structures were created in the physical vacuum deposition process. The paper presents the results of computer simulations of the current flow field in [...] Read more.
The paper presents an analysis of the influence of microcracks in textronic conductive layers on their conductive properties. The tested structures were created in the physical vacuum deposition process. The paper presents the results of computer simulations of the current flow field in thin conductive stripes with defects distributed along a line perpendicular to the stripe axis and randomly placed on its entire surface. It was found, inter alia, that a larger number of shorter collinear defects may have many times lower resistance than a small number of longer defects of the same total length (e.g., with 40 collinear cracks with a total length of 90% of the strip width, the sheet resistance is only about 3% greater compared to a track without cracks). It was found that the percolation threshold of the tested models with square proportions and randomly selected defects is close to the value of 0.5. This is consistent with the theoretical calculations for analogous discrete models with infinite sizes. It was also found that the sheet resistance of the conductive strip with randomly distributed defects clearly depends on its length when the defect concentration exceeds 20%. The simulations were carried out on the basis of the integral equation method, with the solution presented in the form of double layer potentials. Full article
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