New Advances in Optical Imaging and Metrology
A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Optoelectronics".
Deadline for manuscript submissions: closed (16 December 2024) | Viewed by 2410
Special Issue Editors
Interests: optical metrology; 3d shape measurement; 3D deformation measurement
Special Issue Information
Dear Colleagues,
Optical imaging and metrology are rapidly developing fields with numerous applications in various domains, including medicine, biology, engineering, and physics. Recently, this field has been making great progress with prevalence of computational optical imaging and metrology. The development tendency of computational imaging and metrology is towards higher resolution and accuracy, faster processing speed, and more sophisticated algorithms for data analysis and interpretation. One key of this trend is the increasing demand for accurate and efficient measurement and imaging techniques for a wide range of applications. Another important trend is the integration of optics with other technologies, such as artificial intelligence (AI), to enable more advanced data processing and analysis. All these developments enable new applications and capabilities that were previously not possible, and will continue to drive innovation in this exciting field.
This special issue aims to highlight recent advances in the development and application of optical imaging and metrology techniques, with particular emphasis on novel approaches, breakthroughs, and emerging applications.
The topics of interest for this special issue include, but are not limited to:
- Three-dimensional shape and deformation measurement.
- Strain analysis.
- Novel approaches in optical metrology, including fringe projection profilometry, digital image correlation and phase measuring deflectometry.
- Emerging applications of optical techniques in industry, manufacturing, and quality control.
- Computational multispectral imaging
- Novel approaches in computer vision, computaional imaging, deep-learning-based image processing
Dr. Zhoujie Wu
Dr. Junfei Shen
Guest Editors
Manuscript Submission Information
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Keywords
- optical metrology
- 3D shape measurement
- 3D deformation measurement
- strain snslysis
- computaional imgaing
- multispectral imaging
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