Investigation of Local Conduction Mechanisms in Ca and Ti-Doped BiFeO3 Using Scanning Probe Microscopy Approach
Abstract
1. Introduction
2. Experimental
3. Results and Discussion
4. Conclusions
Author Contributions
Funding
Conflicts of Interest
References
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Ivanov, M.S.; Khomchenko, V.A.; Silibin, M.V.; Karpinsky, D.V.; Blawert, C.; Serdechnova, M.; Paixão, J.A. Investigation of Local Conduction Mechanisms in Ca and Ti-Doped BiFeO3 Using Scanning Probe Microscopy Approach. Nanomaterials 2020, 10, 940. https://doi.org/10.3390/nano10050940
Ivanov MS, Khomchenko VA, Silibin MV, Karpinsky DV, Blawert C, Serdechnova M, Paixão JA. Investigation of Local Conduction Mechanisms in Ca and Ti-Doped BiFeO3 Using Scanning Probe Microscopy Approach. Nanomaterials. 2020; 10(5):940. https://doi.org/10.3390/nano10050940
Chicago/Turabian StyleIvanov, Maxim S., Vladimir A. Khomchenko, Maxim V. Silibin, Dmitry V. Karpinsky, Carsten Blawert, Maria Serdechnova, and José A. Paixão. 2020. "Investigation of Local Conduction Mechanisms in Ca and Ti-Doped BiFeO3 Using Scanning Probe Microscopy Approach" Nanomaterials 10, no. 5: 940. https://doi.org/10.3390/nano10050940
APA StyleIvanov, M. S., Khomchenko, V. A., Silibin, M. V., Karpinsky, D. V., Blawert, C., Serdechnova, M., & Paixão, J. A. (2020). Investigation of Local Conduction Mechanisms in Ca and Ti-Doped BiFeO3 Using Scanning Probe Microscopy Approach. Nanomaterials, 10(5), 940. https://doi.org/10.3390/nano10050940