Ivanov, M.S.; Khomchenko, V.A.; Silibin, M.V.; Karpinsky, D.V.; Blawert, C.; Serdechnova, M.; Paixão, J.A.
Investigation of Local Conduction Mechanisms in Ca and Ti-Doped BiFeO3 Using Scanning Probe Microscopy Approach. Nanomaterials 2020, 10, 940.
https://doi.org/10.3390/nano10050940
AMA Style
Ivanov MS, Khomchenko VA, Silibin MV, Karpinsky DV, Blawert C, Serdechnova M, Paixão JA.
Investigation of Local Conduction Mechanisms in Ca and Ti-Doped BiFeO3 Using Scanning Probe Microscopy Approach. Nanomaterials. 2020; 10(5):940.
https://doi.org/10.3390/nano10050940
Chicago/Turabian Style
Ivanov, Maxim S., Vladimir A. Khomchenko, Maxim V. Silibin, Dmitry V. Karpinsky, Carsten Blawert, Maria Serdechnova, and José A. Paixão.
2020. "Investigation of Local Conduction Mechanisms in Ca and Ti-Doped BiFeO3 Using Scanning Probe Microscopy Approach" Nanomaterials 10, no. 5: 940.
https://doi.org/10.3390/nano10050940
APA Style
Ivanov, M. S., Khomchenko, V. A., Silibin, M. V., Karpinsky, D. V., Blawert, C., Serdechnova, M., & Paixão, J. A.
(2020). Investigation of Local Conduction Mechanisms in Ca and Ti-Doped BiFeO3 Using Scanning Probe Microscopy Approach. Nanomaterials, 10(5), 940.
https://doi.org/10.3390/nano10050940
