- Article
Advancing YOLOv8-Based Wafer Notch-Angle Detection Using Oriented Bounding Boxes, Hyperparameter Tuning, Architecture Refinement, and Transfer Learning
- Eun Seok Jun,
- Hyo Jun Sim and
- Seung Jae Moon
Accurate angular alignment of wafers is essential in ion implantation to prevent channeling effects that degrade device performance. This study proposes a real-time notch-angle-detection system based on you only look once version 8 with oriented boun...