3 Results Found

Accurate reference dielectric functions play an important role in the research and development of optical materials. Libraries of such data are required in many applications in which amorphous semiconductors are gaining increasing interest, such as i...

The aim of this work was the determination of the basic optical parameters and electronic structure of conjugated polymer films by two commonly used techniques—spectrophotometry and ellipsometry. Poly(3-hexylthiophene (P3HT) and poly(3-octylthi...

In this work, the results of ellipsometric studies of bilayer films of broadband oxides (Al₂O₃:ZnO, Al₂O₃:TiO₂) are presented. Thin layers of ${\mathrm{A}\mathrm{l}}_2{\mathrm{O}}_3,\mathrm{Z}\mathrm{n}\mathrm{O}$ and $\mathrm{T}\mathrm{i}{\mathrm{O}}_2$ were deposited on silicon substrate using the atomic layer deposition (ALD) method. The d...