- Article
Spectroscopy of Deep Traps in Cu2S-CdS Junction Structures
- Eugenijus Gaubas,
- Ievgen Brytavskyi,
- Tomas Ceponis,
- Vidmantas Kalendra and
- Audrius Tekorius
Cu2S-CdS junctions of the polycrystalline material layers have been examined by combining the capacitance deep level transient spectroscopy technique together with white LED light additional illumination (C-DLTS-WL) and the photo-ionization spectrosc...