Characterization of Nanomaterials by Synchrotron Radiation Techniques

Dear Colleagues,

In recent years, nanomaterials have greatly advanced because of their tremendous potential in many research fields. Synchrotron radiation X-ray characterizations have shown high potential in exploring the causal relationship between the properties and structure of nanomaterials. More specifically, operando synchrotron X-ray measurements could provide useful insight in order to better understand the dynamic process of nanomaterials. Benefiting from the high-brilliance X-ray photons and the broad spectrum of the SR light source, numerous measurement methods were developed to study nanomaterials in various fields, including synchrotron X-ray absorption fine structure spectroscopy (XAFS), synchrotron X-ray diffraction (SXRD), synchrotron X-ray photoelectron spectroscopy (SXPS), and so on. This publication aims to present the advanced SR-based technologies applied to nanomaterials, possible directions for their development, and ways of adapting them to practical applications.

In this Special Issue, original research articles and reviews are welcome. Moreover, we are interested in receiving manuscript contributions in one or more of the following areas:

• Synchrotron X-ray technique and its application within energy storage and conversion nanomaterials;
• Innovative application of synchrotron radiation;
• Synchrotron radiation multiple spectroscopy application;
• Operando synchrotron X-ray technique and its application.

We look forward to receiving your contributions.

Prof. Dr. Shuangming Chen
Guest Editor

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• nanomaterials
• structure–property relationship
• Synchrotron Radiation technique
• operando SR-based technique
• multiple SR-based spectroscopies