Advanced Methods for Studying Thermal Parameters (Thermal Conductivity and Temperature) at the Nanoscale

A special issue of Nanomaterials (ISSN 2079-4991). This special issue belongs to the section "Nanofabrication and Nanomanufacturing".

Deadline for manuscript submissions: closed (20 February 2025) | Viewed by 2603

Special Issue Editor


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Guest Editor
Institute of Physics, Nicolaus Copernicus University, 87-100 Toruń, Poland
Interests: heat transport in thin films and superlattice; photothermal infrared radiometry; new infrared spectroscopic method

Special Issue Information

Dear Colleagues,

The issues of heat propagation and temperature measurement in nanosystems are attracting increasing attention. The dissipation of heat in nanosystems is significantly different than in bulk materials. In this Special Issue, we would like to encourage authors to present their latest research on nanomaterials and heat; various types of articles are welcome, such as experimental (the lock-in-based method or classical approaches) and theoretical studies on nanomaterials such as nanodots, nanowires, superlattices, polymers, and ZnO-based materials. These studies should report on the nanomaterials’ properties (thermal conductivity, thermal diffusivity, thermal boundary resistance, temperature, heat capacity) as well as the development of the measurement methods used (such as photothermal infrared radiometry, thermoreflectance, photothermal beam deflections, and luminescent thermometry). A particularly important aspect of this Special Issue is the comparison of experimental data with the results of theoretical work; therefore, both types of work are welcome. We also encourage papers describing new materials, new research methods for measuring temperature and thermal conductivity, thermal diffusivity, and thermal boundary resistance at the nanoscale. Papers on improving existing methods are also welcome.

We are looking for all types of papers, so please contact me if you are unsure whether your article fits within this Special Issue.

Prof. Dr. Michal Pawlak
Guest Editor

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Keywords

  • thermal conductivity
  • temperature
  • nanomaterials
  • thermal diffusivity
  • thermal boundary resistance
  • luminescent thermometry
  • thermal-wave-based method

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Published Papers (2 papers)

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Research

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9 pages, 2796 KiB  
Article
Luminescent Nanocrystal Probes for Monitoring Temperature and Thermal Energy Dissipation of Electrical Microcircuit
by Dawid Jankowski, Kamil Wiwatowski, Michał Żebrowski, Aleksandra Pilch-Wróbel, Artur Bednarkiewicz, Sebastian Maćkowski and Dawid Piątkowski
Nanomaterials 2024, 14(24), 1985; https://doi.org/10.3390/nano14241985 - 11 Dec 2024
Cited by 1 | Viewed by 891
Abstract
In this work, we present an experimental approach for monitoring the temperature of submicrometric, real-time operating electrical circuits using luminescence thermometry. For this purpose, we utilized lanthanide-doped up-converting nanocrystals as nanoscale temperature probes, which, combined with a highly sensitive confocal photoluminescence microscope, enabled [...] Read more.
In this work, we present an experimental approach for monitoring the temperature of submicrometric, real-time operating electrical circuits using luminescence thermometry. For this purpose, we utilized lanthanide-doped up-converting nanocrystals as nanoscale temperature probes, which, combined with a highly sensitive confocal photoluminescence microscope, enabled temperature monitoring with spatial resolution limited only by the diffraction of light. To validate our concept, we constructed a simple model of an electrical microcircuit based on a single silver nanowire with a diameter of approximately 100 nm and a length of about 50 µm, whose temperature increase was induced by electric current flow. By driving electric current only along one half of the nanowire, we created a dual-function microstructure, where one section is a resistive heater, while the other operates as a radiator. Such a combination realistically reflects the electronic circuit and its thermal behavior. We demonstrated that nanocrystals distributed around this circuit allow for remote temperature readout and enable precise monitoring of the thermal energy propagation and heat dissipation processes, which are crucial for designing and developing highly integrated electronic on-chip devices. Full article
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Review

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18 pages, 7290 KiB  
Review
Photothermal Infrared Radiometry and Thermoreflectance—Unique Strategy for Thermal Transport Characterization of Nanolayers
by Ankur Chatterjee, Mohanachandran Nair Sindhu Swapna, Ameneh Mikaeeli, Misha Khalid, Dorota Korte, Andreas D. Wieck and Michal Pawlak
Nanomaterials 2024, 14(21), 1711; https://doi.org/10.3390/nano14211711 - 27 Oct 2024
Viewed by 1202
Abstract
Thermal transport properties for the isotropic and anisotropic characterization of nanolayers have been a significant gap in the research over the last decade. Multiple studies have been close to determining the thermal conductivity, diffusivity, and boundary resistance between the layers. The methods detailed [...] Read more.
Thermal transport properties for the isotropic and anisotropic characterization of nanolayers have been a significant gap in the research over the last decade. Multiple studies have been close to determining the thermal conductivity, diffusivity, and boundary resistance between the layers. The methods detailed in this work involve non-contact frequency domain pump-probe thermoreflectance (FDTR) and photothermal radiometry (PTR) methods for the ultraprecise determination of in-plane and cross-plane thermal transport properties. The motivation of one of the works is the advantage of the use of amplitude (TR signal) as one of the input parameters along with the phase for the determination of thermal parameters. In this article, we present a unique strategy for measuring the thermal transport parameters of thin films, including cross-plane thermal diffusivity, in-plane thermal conductivity, and thermal boundary resistance as a comprehensively reviewed article. The results obtained for organic and inorganic thin films are presented. Precise ranges for the thermal conductivity can be across confidence intervals for material measurements between 0.5 and 60 W/m-K for multiple nanolayers. The presented strategy is based on frequency-resolved methods, which, in contrast to time-resolved methods, make it possible to measure volumetric-specific heat. It is worth adding that the presented strategy allows for accurate (the signal in both methods depends on cross-plane thermal conductivity and thermal boundary resistance) and precise measurement. Full article
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