Special Issue "Advanced Synchrotron Techniques for Soft and Nanomaterials"
Deadline for manuscript submissions: 15 November 2019
Prof. Andrei V. Petukhov
van ’t Hoff laboratory for physical & colloid chemistry, Debye Institute for Nanomaterials Science, Utrecht University, The Netherlands and Laboratory of Physical Chemistry, Eindhoven University of Technology, The Netherlands
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Interests: Colloids and nanoparticles; Self-organisation; Colloidal crystals; Colloidal liquid crystals; Chiral colloids; Active matter and dissipative assembly; Advanced synchrotron scattering techniques; Microscopy at the nanoscale
Materials in the 21st century have been revolutionised by the advent of nanomaterials and soft matter. These two concepts strongly overlap, although some subtle differences exist, for example not all nanomaterials are seen as soft, while practically all soft matter systems have a structure at the nanoscale. This nanostructuring provides unprecedent opportunities for the engineering of mechanical, optical, electronic and magnetic properties. Some authors prefer to identify their experimental systems as nanomaterials, and others prefer the soft matter concept instead. To welcome both groups, “Soft and Nanomaterials” are introduced in the title of this issue.
Further progress in the fields of nanomaterials and soft matter crucially depends on the availability of advanced experimental techniques that allow the characterisation of various aspects of the nanoscale structure and its relation to material properties. This Special Issue is devoted to recent developments in analytical tools using synchrotron radiation. Small angle x-ray scattering (SAXS) is one of the indispensable tools at the nanoscale. Recent developments in this area towards ultra-small angles and microradian resolution allow us to broaden the range of available spatial scales. Faster detectors and higher-brightness sources have recently improved the time resolution of in-situ studies. Micro- and nano-sized beams can be applied to obtain local spatially-resolved data. The improved coherence of X-ray beams promotes the application and further development of coherent techniques such as X-ray photon correlation spectroscopy (XPCS) and coherent diffraction imaging (CDI). Grazing-incidence SAXS (GISAXS) and x-ray reflectivity (XRR) allow researchers to study surfaces including soft and liquid interfaces. Spectromicroscopy using X-rays close to the adsorption edge of a specific element has been shown to provide element-specific chemical information with nanometric resolution. The hard X-ray microscopy with a much larger penetration depth is shifting to the nanoscale. X-ray spectroscopy is slowly progressing to meet the challenges of nanomaterials, soft matter and biological materials. Much progress has recently been seen in the development of the sample environment. I believe that this issue will contribute to the discussion of recent developments of techniques similar to those mentioned above and of their recent applications for soft matter and nanomaterials.
It is my pleasure to invite you to submit a manuscript to this Special Issue. Full papers, communications and reviews discussing recent developments and applications of Advanced Synchrotron Techniques for Soft and Nanomaterials are welcome.
Prof. Andrei V. Petukhov
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All papers will be peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
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- soft matter
- synchrotron radiation
- small-angle x-ray scattering (SAXS)
- x-ray photon correlation spectroscopy (XPCS)
- coherent diffraction imaging (CDI)
- x-ray reflectivity (XRR)
- x-ray spectroscopies
- x-ray spectromicroscopy
- high-resolution hard x-ray microscopy