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Preparation, Characterization and Application of Metal Oxide Thin Films

This special issue belongs to the section “Thin Films and Interfaces“.

Special Issue Information

Dear Colleagues,

Metal oxide thin films have been widely used in various applications such as sensors, semiconductors, displays, and optical fields. There are various techniques, such as physical vapor deposition (PVD), chemical vapor deposition (CVD), atomic layer deposition(ALD), and sol–gel coating as methods for forming metal oxide thin films. Such metal oxide films could have a porous or very dense structure. Our aim is for this Special Issue to broadly cover the formation mechanism of structure of metal oxide thin films, unique methods for analyzing these thin films, and their potential applications to high-tech industry. Additionally, even if not included in the list below, this Special Issue invites papers from the very wide research fields adjacent to or indirectly related to metal oxide thin films.

Prof. Hee Chul Lee
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Materials is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • Metal oxide thin films
  • Physical vapor deposition (PVD)
  • Chemical vapor deposition (CVD)
  • Atomic layer deposition (ALD)
  • Plasma-enhanced deposition
  • Sol–gel coating
  • Thin film analysis
  • Sensor devices
  • Thin film transistors
  • Optoelectronic application

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Materials - ISSN 1996-1944