Applications of Scanning Probe Microscopy (SPM)-Methods in Materials Science
A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Materials Characterization".
Deadline for manuscript submissions: closed (31 October 2021) | Viewed by 3211
Special Issue Editor
Interests: metals; glasses; surface science; tribology; mechanical properties
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
The inventions of scanning tunneling microscopy (STM) in 1980 and atomic force microscopy (AFM) in 1985 revolutionized the nano-scale characterization of materials surfaces. While the application of STM is limited to conductive materials, AFM can be applied on virtually any materials, from soft (living cells, tissues, gels, and polymers) to hard (metals, ceramics, and glasses).
In scanning probe microscopy (SPM), a micro-manufactured cantilever with a nano-sized tip at its end is used to probe interactions with a sample surface. Meanwhile, cantilevers with various stiffness and tips with different sizes and of different chemistries are available. Once used to image the surface morphology of samples, SPM has become a versatile method to probe various interactions between a tip and a sample surface, such as mechanical, thermal, electrical, and magnetic. Furthermore, AFM can be used in different environmental conditions from ultrahigh vacuum to chemically aggressive. With these developments, SPM is now an unavoidable tool to characterize the response of materials and devices to various solicitations with nanometer resolution and beyond.
We invite researchers to contribute to the Special Issue on “Applications of Scanning Probe Microscopy (SPM)—Methods in Materials Science”. This Special Issue is intended to serve as a forum covering recent developments and applications of SPM in the field of materials science. Potential topics include but are not limited to:
- Nano-mechanics of materials and devices;
- Micro- and meso-structural characterization of materials;
- Characterization of surface and buried defects;
- Characterization of electronic materials and their devices;
- Corrosion and surface chemistry of materials.
Dr. Arnaud Caron
Guest Editor
Manuscript Submission Information
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Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Materials is an international peer-reviewed open access semimonthly journal published by MDPI.
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Keywords
- scanning probe microscopy
- surface science
- surface chemistry
- nano-mechanics
- electronics
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