In Situ Characterization of Functional Materials via Electron Microscopy Techniques
A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Materials Characterization".
Deadline for manuscript submissions: closed (10 March 2024) | Viewed by 499
Special Issue Editor
Special Issue Information
Dear Colleagues,
In situ spectroscopy and microscopy present exciting opportunities to gain valuable insights into the behavior of functional materials. These techniques enable researchers to make real-time observations under realistic operating conditions, providing a deeper understanding of their properties and dynamics. This Special Issue aims to highlight the latest developments in in situ electron microscopy techniques, a practice that will facilitatexe ploration of the dynamic behavior and structural changes of functional materials across micro to atomic scales.
We invite researchers to submit their work on functional materials under different environments, including high temperatures, pressures, and electric fields. This Special Issue aims to encompass a broad range of functional materials, such as ferroelectrics, piezoelectrics, catalysts, and energy storage materials, among others.
Contributions should focus on in situ electron microscopy techniques, such as TEM and SEM. The Issue aims to provide a valuable discussion on materials with high temporal and spatial resolution to capture the dynamic processes of functional materials. Moreover, we particularly welcome works that address the challenges associated with studying materials in extreme environments as they offer valuable insights for future research endeavors.
In the practice of researchers sharing their findings, they contribute to the advancement of our understanding of functional materials and the development of in situ characterization techniques.
Dr. Miryam Arredondo
Guest Editor
Manuscript Submission Information
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Keywords
- in situ spectroscopy and microscopy
- extreme environments
- temporal and spatial resolution
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