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Special Issue "In Situ Characterization of Functional Materials via Electron Microscopy Techniques"

A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Materials Characterization".

Deadline for manuscript submissions: 10 March 2024 | Viewed by 114

Special Issue Editor

Dr. Miryam Arredondo
E-Mail Website
Guest Editor
School of Mathematics and Physics, Queen’s University, Belfast, UK
Interests: electron microscopy techniques; in situ imaging techniques; functional materials; nanoscale physics

Special Issue Information

Dear Colleagues,

In situ spectroscopy and microscopy present exciting opportunities to gain valuable insights into the behavior of functional materials. These techniques enable researchers to make real-time observations under realistic operating conditions, providing a deeper understanding of their properties and dynamics. This Special Issue aims to highlight the latest developments in in situ electron microscopy techniques, a practice that will facilitatexe ploration of the dynamic behavior and structural changes of functional materials across micro to atomic scales.

We invite researchers to submit their work on functional materials under different environments, including high temperatures, pressures, and electric fields. This Special Issue aims to encompass a broad range of functional materials, such as ferroelectrics, piezoelectrics, catalysts, and energy storage materials, among others.

Contributions should focus on in situ electron microscopy techniques, such as TEM and SEM. The Issue aims to provide a valuable discussion on materials with high temporal and spatial resolution to capture the dynamic processes of functional materials. Moreover, we particularly welcome works that address the challenges associated with studying materials in extreme environments as they offer valuable insights for future research endeavors.

In the practice of researchers sharing their findings, they contribute to the advancement of our understanding of functional materials and the development of in situ characterization techniques.

Dr. Miryam Arredondo
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Materials is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.


  • in situ spectroscopy and microscopy
  • extreme environments
  • temporal and spatial resolution

Published Papers

This special issue is now open for submission.
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