Material Surface and Interface Measurement and Characterisation
A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Materials Characterization".
Deadline for manuscript submissions: closed (20 June 2024) | Viewed by 512
Special Issue Editors
Interests: in-process surface optical metrology and instrumentation; thin-film measurement and responsive manufacturing
Interests: in-process surface metrology; optical instrumentation; surface reconstruction; signal analysis; metrology driven by nanophotonics
Interests: surface metrology; manufacturing processes; precision engineering; additive manufacturing
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Material surfaces and interfaces play a crucial role in determining the functional performance of advanced materials, as they greatly influencing the behaviour of materials such as their corrosion resistance, adhesion, tribological properties, and electrochemical behaviour. Manufacturing precision materials at a large scale will require the creation of smart processes, including real-time quality assurance methods. Embedded metrology instrumentation and characterisation algorithms, combined with big data handling mechanism and artificial intelligence, will pave the way toward the development of autonomous advanced manufacturing methods.
A wide range of techniques, tools, and algorithms are being developed, each with their own advantages and limitations for studying materials’ surface and interface. For example, the use of ellipsometry and interferometry techniques has enabled quality assurance of nano-scale thin-film fabrication.
In this special issue, we welcome all research articles on a range of topics, including but not limited to optical metrology and the development/applications of on-machine/in-process measurement methods for responsive manufacturing to investigate surface topography and interface.
Dr. Hussam Muhamedsalih
Dr. Dawei Tang
Prof. Dr. Liam Blunt
Guest Editors
Manuscript Submission Information
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Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Materials is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- surface and interface measurement
- surface inspection and defect detection
- optical metrology
- thin film measurement
- on-machine/in situ measurement
- algorithms for surface characterization
- artificial intelligence for responsive manufacturing
- big data handling for large-area metrology
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