Atomic Force Microscopy (AFM) in Materials Science
A special issue of Coatings (ISSN 2079-6412). This special issue belongs to the section "Surface Characterization, Deposition and Modification".
Deadline for manuscript submissions: closed (15 June 2021) | Viewed by 438
Special Issue Editor
Interests: self-assembly; electrochemistry; solid–liquid interface; atomic force microscopy; thin films; interfacial adhesion; molecule electronics; polymers
Special Issue Information
Dear Colleagues,
The modification of surfaces with thin films is a widespread strategy in the field of materials science. In this regard, atomic force microscopy (AFM)-based techniques arise as a relevant tool for the characterization and quantification of fundamental properties of molecule, biomolecule, (bio)polymer, metal or metal oxide layers at the nanoscale level. This Special Issue aims to cover all aspects of AFM applied to the study of the latter thin films with special relevance to the materials science community, including nascent AFM-based modes, investigation of structural and functional characterization, basic mechanisms and interactions, characterization and quantification of material properties, and technological applications. AFM applied to the characterization of film conductance, surface potential, or magnetic properties will be considered. Special attention will be given to the combination of AFM with optical techniques, namely, AFM-IR, sSNOM, and TERS. The in situ combinations of AFM with electrochemical techniques such as electrografting, i.e., electrochemical nanolithography, but also with scanning electrochemical microscopy (AFM-SECM) would also be an asset. The characterization of the mechanical properties of thin films is included in the scope of this Special Issue too.
In particular, the topics of interest include but are not limited to:
- Nascent AFM modes applied to coatings technology;
- Self-assembly of molecules and macromolecules;
- Elucidation of the binding mechanism of molecule, biomolecules, polymer, or biopolymers to surfaces (metal, metal oxide, carbonous and polymeric materials);
- Combination of AFM with optical techniques: AFM-IR, sSNOM, and TERS;
- The characterization of conductance, magnetic, and/or mechanical properties of metal/metal oxide layers or molecule-based thin films;
- EC-AFM and AFM-SECM.
Dr. Alejandro Gonzalez Orive
Guest Editor
Manuscript Submission Information
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Keywords
- atomic force microscopy
- thin films
- single-molecule force spectroscopy
- interfacial adhesion
- mechanical properties
- conductance
- surface potential
- magnetism
- electrografting
- self-assembly
- macromolecules
- coatings
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