Open AccessArticle
Background and Blended Spectral Line Reduction in Precision Spectroscopy of EUV and X-ray Transitions in Highly Charged Ions
by
Adam Hosier, Dipti, Yang Yang, Paul Szypryt, Grant P. Mondeel, Aung Naing, Joseph N. Tan, Roshani Silwal, Galen O’Neil, Alain Lapierre, Steven A. Blundell, John D. Gillaspy, Gerald Gwinner, Antonio C. C. Villari, Yuri Ralchenko and Endre Takacs
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Abstract
Extreme ultraviolet spectra of Na-like and Mg-like Os and Ir were recorded at the National Institute of Standards and Technology using a grazing incidence spectrometer. We report a method in EBIT spectral analysis that reduces signals from contaminant lines of known or unknown
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Extreme ultraviolet spectra of Na-like and Mg-like Os and Ir were recorded at the National Institute of Standards and Technology using a grazing incidence spectrometer. We report a method in EBIT spectral analysis that reduces signals from contaminant lines of known or unknown origin. We utilize similar ion charge distributions of heavy highly charged ions that create similar potentials for lighter contaminating background elements. First-order approximations to ion distributions are presented to demonstrate differences between impurity elements with and without heavy ions present.
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