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Investigation of Nanostructures with X-ray Scattering Techniques

1
Max Planck Institute for Chemical Physics of Solids, Nöthnitzer Str 40, 01187 Dresden, Germany
2
Institute of Physics ASCR, v.v.i., Cukrovarnicka 10, 162 53 Prague 6, Czech Republic
3
Department of Condensed Matter Physics, Faculty of Mathematics and Physics of Charles University, Ke Karlovu 5, 121 16 Prague, Czech Republic
*
Author to whom correspondence should be addressed.
Crystals 2019, 9(10), 500; https://doi.org/10.3390/cryst9100500
Received: 23 September 2019 / Accepted: 24 September 2019 / Published: 26 September 2019
(This article belongs to the Special Issue Investigation of Nanostructures with X-ray Scattering Techniques)
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Keywords: organic films; magnetic thin films; nanowires; scanning X-ray diffraction; anomalous X-ray diffraction; nanoparticles; quantum dots; grazing incidence small angle X-ray scattering; X-ray beam induced current organic films; magnetic thin films; nanowires; scanning X-ray diffraction; anomalous X-ray diffraction; nanoparticles; quantum dots; grazing incidence small angle X-ray scattering; X-ray beam induced current
MDPI and ACS Style

Kriegner, D.; Dopita, M. Investigation of Nanostructures with X-ray Scattering Techniques. Crystals 2019, 9, 500.

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