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Open AccessArticle

Measuring the Pull-Off Force of an Individual Fiber Using a Novel Picoindenter/Scanning Electron Microscope Technique

1
Engineering Product Development (EPD) Pillar, Singapore University of Technology and Design, 8 Somapah Rd, Singapore 487372, Singapore
2
The Xtreme Materials Laboratory (XML), Singapore University of Technology and Design, 8 Somapah Rd, Singapore 487372, Singapore
*
Authors to whom correspondence should be addressed.
Materials 2017, 10(9), 1074; https://doi.org/10.3390/ma10091074
Received: 4 August 2017 / Revised: 10 September 2017 / Accepted: 11 September 2017 / Published: 13 September 2017
(This article belongs to the Special Issue Electrospun Materials 2018)
We employed a novel picoindenter (PI)/scanning electron microscopy (SEM) technique to measure the pull-off force of an individual electrospun poly(vinylidene fluoride) (PVDF) fibers. Individual fibers were deposited over a channel in a custom-designed silicon substrate, which was then attached to a picoindenter. The picoindenter was then positioned firmly on the sample stage of the SEM. The picoindenter tip laterally pushed individual fibers to measure the force required to detach it from the surface of substrate. SEM was used to visualize and document the process. The measured pull-off force ranged between 5.8 ± 0.2 μN to ~17.8 ± 0.2 μN for individual fibers with average diameter ranging from 0.8 to 2.3 μm. Thus, this study, a first of its kind, demonstrates the use of a picoindenter to measure the pull-off force of a single micro/nanofiber. View Full-Text
Keywords: picoindenter; SEM; pull-off force; mechanical properties; electrospinning picoindenter; SEM; pull-off force; mechanical properties; electrospinning
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MDPI and ACS Style

Sahay, R.; Radchenko, I.; Budiman, A.S.; Baji, A. Measuring the Pull-Off Force of an Individual Fiber Using a Novel Picoindenter/Scanning Electron Microscope Technique. Materials 2017, 10, 1074.

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