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Open AccessArticle

Cu6Sn5 Whiskers Precipitated in Sn3.0Ag0.5Cu/Cu Interconnection in Concentrator Silicon Solar Cells Solder Layer

1
School of Mechatronic Engineering, Jiangsu Normal University, Xuzhou 221116, China
2
Institute of Metal Research, Chinese Academy of Science, Shenyang 110016, China
3
State Key Laboratory of Advanced Brazing Filler Metals & Technology, Zhengzhou Research Institute of Mechanical Engineering, Zhengzhou 450001, China
*
Author to whom correspondence should be addressed.
Academic Editor: Lioz Etgar
Materials 2017, 10(4), 327; https://doi.org/10.3390/ma10040327
Received: 6 February 2017 / Revised: 8 March 2017 / Accepted: 13 March 2017 / Published: 23 March 2017
Cu6Sn5 whiskers precipitated in Sn3.0Ag0.5Cu/Cu interconnection in concentrator silicon solar cells solder layer were found and investigated after reflow soldering and during aging. Ag3Sn fibers can be observed around Cu6Sn5 whiskers in the matrix microstructure, which can play an active effect on the reliability of interconnection. Different morphologies of Cu6Sn5 whiskers can be observed, and hexagonal rod structure is the main morphology of Cu6Sn5 whiskers. A hollow structure can be observed in hexagonal Cu6Sn5 whiskers, and a screw dislocation mechanism was used to represent the Cu6Sn5 growth. Based on mechanical property testing and finite element simulation, Cu6Sn5 whiskers were regarded as having a negative effect on the durability of Sn3.0Ag0.5Cu/Cu interconnection in concentrator silicon solar cells solder layer. View Full-Text
Keywords: Cu6Sn5 whiskers; Ag3Sn fibers; mechanical property; screw dislocation Cu6Sn5 whiskers; Ag3Sn fibers; mechanical property; screw dislocation
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MDPI and ACS Style

Zhang, L.; Liu, Z.-Q.; Yang, F.; Zhong, S.-J. Cu6Sn5 Whiskers Precipitated in Sn3.0Ag0.5Cu/Cu Interconnection in Concentrator Silicon Solar Cells Solder Layer. Materials 2017, 10, 327.

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