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Metrology at High-Power Laser Facilities: Primary and Secondary Laser-Driven Sources

This special issue belongs to the section “Lasers, Light Sources and Sensors“.

Special Issue Information

Keywords

  • extreme light facilities
  • ultra-intense laser pulses
  • ultrafast metrology
  • laser-driven radiation sources (electron, ion and proton, etc.) metrology
  • diagnostic devices, procedures, and protocols for metrology
  • electromagnetic, terahertz, infrared, visible, ultraviolet, X-ray and gamma radiation metrology

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Published Papers

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Photonics - ISSN 2304-6732