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Virtual Measuring Systems and Digital Twins

Special Issue Information

Dear Colleagues,

In the course of the digital transformation, the importance of mathematical–physical simulations and in silico experiments is increasing rapidly. If real measuring equipment and measurements are simulated with such simulations, this can be called a “virtual measuring device” or “virtual measurement”. In many areas, these are now in everyday use. For example, simulations serve to gain a better understanding of the real experiment, to plan new experiments or to evaluate existing ones. In the meantime, simulations are increasingly being used as an essential component of a real measurement, usually as part of an inverse problem.

In this development, the task of metrology is to secure confidence in simulation results when they are used in the same way as or combined with real measurements. From the point of view of metrology, this results in several overriding questions:

  1. How to ensure confidence in simulation results
  2. How to establish comparability of virtual and real measurements
  3. Which standards for interfaces, metadata and data formats are necessary

Treatment of these issues requires continuous and intensive interdisciplinary cooperation in addressing simulations, virtual experiments, digital twins, software architectures, validation, calibration, machine learning, and artificial intelligence methods.

This Special Issue is related to the VirtMet Workshop 2021. In addition to VirtMet Workshop 2021 papers, other independent submissions are also welcome.

Dr. Sascha Eichstädt
Prof. Dr. Markus Bär
Dr. Karin Kniel
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Metrology is an international peer-reviewed open access quarterly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1200 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • simulation
  • digital twin
  • virtual measurement
  • uncertainty
  • machine learning
  • software
  • calibration
  • validation

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Metrology - ISSN 2673-8244