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Special Issue "X-ray Imaging in Materials Science"
A special issue of Materials (ISSN 1996-1944).
Deadline for manuscript submissions: closed (31 August 2012).
Tel. +82 010 3821 2143; Fax: +82 54 279 2992
Interests: wetting on soft material, drop impact, x-ray imaging; x-ray diffraction, organic nanowires, silicon carbide, microradiology; microtomography
The theme of this special issue is X-ray Imaging that focuses on instrumentation and application of X-ray microscopy in materials science. X-ray imaging with recent improvements in sources and optics is rapidly expanding in research and science of various materials including soft materials, condensed-matter materials, biomaterials, nanomaterials, etc.
This issue of Materials covers current advances in X-ray imaging techniques such as phase-contrast imaging, coherent diffraction imaging, tomography, topography, and their applications to materials science. Perspectives are welcome on upcoming new techniques or facilities, especially X-ray free-electron laser (XFEL), which will greatly extend X-ray imaging to femtosecond time domain and to interatomic length scales. Finally, we encourage considering a variety of X-ray-induced interactions, which become important for the synthesis of new materials, for the discovery of new phenomenon, or for the prevention of radiation damages, since material properties could be significantly changed with X-ray irradiation.
Prof. Dr. Jung Ho Je
- X-ray imaging
- X-ray microscopy
- Coherent diffraction imaging
- Phase contrast imaging
- X-ray optics
- X-ray-induced phenomena