Fatigue and Fracture of Crystalline Metal Structures

Dear Colleagues, 

Fatigue and fracture cause massive losses to the economy, about 4% GDP (gross domestic product). Crystalline metal structures are intensively developed by materials science and extensively used in many applications, such as mechanical, civil, and aerospace engineering.

This Special Issue (SI) aims to publish high-quality, original papers that provide new data, fatigue and fracture phenomena and insights into the behaviors, processes, and mechanisms dominating fatigue and fracture of metallic materials with crystal structures in theoretical formulations, numerical simulations, physical and machine learning based models, laboratorial experiments and case studies.

Fatigue and fracture are highly dependent on the microstructure bearing the external loads, including monotonic, cyclic, shock, and waves. Thus, microstructure investigations associated with the damage accumulation and elastoplastic deformations are strongly recommended, including but not limited to the following: characterizations of XRD (X-ray diffraction), SEM (scanning electron microscopy), TEM (transmission electron microscopy), FIB (focused ion beam) and EBSD (electron backscatter diffraction) and modeling of CALPHAD (computer coupling of phase diagrams and thermochemistry), FEM (finite element method), crystal plasticity and MD (molecular dynamics).

For many metallic materials, especially additively manufactured (AM) metals and alloys, non-metallic inclusions, AM defects or other inhomogeneities always have crucial roles in crack initiation and growth due to stress concentration. Contributions related to this area are very welcome. Engineering vibration is one of the most important factors of external loads, making fatigue failure a key component in civil or aerospace applications. Contributions based on the modal analysis, the measurement and/or calculation of the field of stress and strain in the vibrated structures of crystalline metallic materials are also welcome.

Dr. Xiangnan Pan
Dr. Abílio M. P. De Jesus
Guest Editors

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