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Deep Learning Techniques for Object Detection and Tracking

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Computing and Artificial Intelligence".

Deadline for manuscript submissions: 20 September 2026 | Viewed by 1554

Special Issue Editor


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Guest Editor
Division of AI Engineering, Sookmyung Women's University, Seoul 04310, Republic of Korea
Interests: deep learning; multimedia processing; visual intelligence; emotion recognition
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

This Special Issue aims to explore recent advancements in deep learning techniques for object detection and tracking, focusing on both fundamental algorithmic developments and real-world applications across diverse domains such as autonomous systems, surveillance, robotics, and medical imaging.

A particular emphasis is placed on the integration of Large Language Models (LLMs) and foundation models for Vision–Language Models (VLMs), which are reshaping the landscape of multimodal perception. These powerful architectures enable context-aware object understanding and open-ended visual question answering, bridging the gap between semantic language descriptions and visual detection tasks. Contributions that investigate prompt-based visual tracking, cross-modal learning, and zero-shot detection using pre-trained foundation models are highly encouraged.

We welcome original research and review articles on topics including, but not limited to, the following:

  • Deep neural networks for object detection and multi-object tracking;
  • Transformer-based and attention-driven detection frameworks;
  • Real-time tracking and re-identification;
  • Multimodal detection using VLMs and LLM-guided perception;
  • Self-supervised and unsupervised learning for detection;
  • Transfer learning and domain adaptation in tracking systems;
  • Applications of foundation models (e.g., CLIP, DINO, SAM, GPT-V) in vision–language tasks.

This Special Issue seeks to provide a timely platform for showcasing innovative solutions that push the boundaries of intelligent visual perception.

Prof. Dr. Byung-Gyu Kim
Guest Editor

Manuscript Submission Information

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Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • object detection
  • multi-object tracking
  • deep learning
  • transformer-based models
  • large language models (LLMs)
  • vision–language models (VLMs)

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Published Papers (1 paper)

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Research

31 pages, 11602 KB  
Article
PCB-Faster-RCNN: An Improved Object Detection Algorithm for PCB Surface Defects
by Zhige He, Yuezhou Wu, Yang Lv and Yuanqing He
Appl. Sci. 2025, 15(24), 12881; https://doi.org/10.3390/app152412881 - 5 Dec 2025
Cited by 2 | Viewed by 1107
Abstract
As a fundamental and indispensable component of modern electronic devices, the printed circuit board (PCB) has a complex structure and highly integrated functions, with its manufacturing quality directly affecting the stability and reliability of electronic products. However, during large-scale automated PCB production, its [...] Read more.
As a fundamental and indispensable component of modern electronic devices, the printed circuit board (PCB) has a complex structure and highly integrated functions, with its manufacturing quality directly affecting the stability and reliability of electronic products. However, during large-scale automated PCB production, its surfaces are prone to various defects and imperfections due to uncontrollable factors, such as diverse manufacturing processes, stringent machining precision requirements, and complex production environments, which not only compromise product functionality but also pose potential safety hazards. At present, PCB defect detection in industry still predominantly relies on manual visual inspection, the efficiency and accuracy of which fall short of the automation and intelligence demands in modern electronics manufacturing. To address this issue, in this paper, we have made improvements based on the classical Faster-RCNN object detection framework. Firstly, ResNet-101 is employed to replace the conventional VGG-16 backbone, thereby enhancing the ability to perceive small objects and complex texture features. Then, we extract features from images by using deformable convolution in the backbone network to improve the model’s adaptive modeling capability for deformed objects and irregular defect regions. Finally, the Convolutional Block Attention Module is incorporated into the backbone, leveraging joint spatial and channel attention mechanisms to improve the effectiveness and discriminative power of feature representations. The experimental results demonstrate that the improved model achieves a 4.5% increase in mean average precision compared with the original Faster-RCNN. Moreover, the proposed method exhibits superior detection accuracy, robustness, and adaptability compared with mainstream object detection models, indicating strong potential for engineering applications and industrial deployment. Full article
(This article belongs to the Special Issue Deep Learning Techniques for Object Detection and Tracking)
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