Photonic Technology for Precision Metrology

Dear Colleagues,

Photonics as the science of photon has a decisive influence on the recent scientific and technology achievements. It includes aspects of photon generation and photon-matter interaction. Although it finds many applications in the whole optical range of the wavelengths, most solutions operates in the visible and infrared range. Since the laser invention – source of the highly coherent optical radiation, optical measurements have become a perfect tool for highly precise and accurate measurements. Such measurements have additional advantages of non-contact and fast rate suitable for in-process metrology. However, their extremely precision is ultimately limited by e.g. noise of both lasers and photodetectors.

The Special Issue of the Applied Science is devoted to cutting-edge uses of optical sources, detectors and optoelectronics systems in numerous fields of science and technology (e.g. industry, environment, healthcare, telecommunication, security and space). The aim is to provide the state-of-the-art of photonic technology for precision metrology, and to identify directions for its future development.  This issue focuses on metrology principles and measurement instrumentation in optical technology to solve challenging engineering problems.

Technical topics include (but are not limited):

• optical imaging and reflectometry
• interferometry and spectroscopy
• radiometry and photometry
• remote and in-situ sensing
• optoelectronic sensors and smart-sensors
• optical sensors for robots and unmanned systems
• industrial optical measurements
• high resolution optical metrology
• fiber-optic measurements
• optical frequency metrology and optical clocks
• optical sources and detectors
• photonic metrological technology for science, environment, medicine, security, telecommunication, and space.

Dr. Jacek Wojtas
Guest Editor

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