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Machine Learning in Remote Sensing Image Classification and Recognition

This special issue belongs to the section “Computing and Artificial Intelligence“.

Special Issue Information

Dear Colleagues,

Recent years have witnessed the ever-growing availability of multi-source high-resolution remote sensing (RS) images (e.g., optical imagery and SAR) from sensors installed on satellites, aircraft, etc. These substantial quantities of RS images provide accurate, diverse, and complementary insights for a better understanding of Earth (e.g., fine-grained land cover classification and target recognition).

To extract meaningful information, machine learning based techniques, such as convolutional neural networks, attention mechanisms, and transformer systems, have achieved ground-breaking performances in natural image interpretation. However, several challenges and open issues remain to be addressed in the RS image classification and recognition field, including the need to develop novel methods of feature representations as well as efficient feature matching algorithms to handle high-resolution imagery on a massive scale.

This Special Issue is devoted to developing state-of-the-art machine learning methods for more accurate remote sensing classification and recognition tasks. Prospective authors are invited to submit their original unpublished contributions to this Special Issue.

Dr. Yuqi Han
Dr. Wenzheng Wang
Dr. Linbo Tang
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • representation learning
  • classification and recognition
  • high-resolution remote sensing
  • pattern recognition
  • artificial intelligence

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Appl. Sci. - ISSN 2076-3417