X-ray Scattering Characterization in Materials Science
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Materials Science and Engineering".
Deadline for manuscript submissions: 30 November 2025 | Viewed by 735
Special Issue Editor
Special Issue Information
Dear Colleagues,
This Special Issue focuses on the innovative use of X-ray scattering techniques to elucidate the structural, electronic, and mechanical properties of materials. Contributions are invited that highlight advancements in small-angle X-ray scattering (SAXS), wide-angle X-ray scattering (WAXS), and X-ray diffraction (XRD) methods applied to diverse material systems, including nanomaterials, polymers, biomaterials, and thin films.
We seek original research articles, reviews, and technical notes that explore the development of novel X-ray scattering methodologies, in situ and operando experiments, computational approaches for data analysis, and databases for materials informatics. Emphasis will be placed on studies that demonstrate how X-ray scattering can provide critical insights into material behavior under various conditions, driving innovation in material design and application. This issue aims to be a comprehensive resource for researchers and practitioners looking to leverage X-ray scattering in their materials science investigations, ultimately contributing to advancements in technology and industry applications.
Dr. Yoshiharu Sakurai
Guest Editor
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Keywords
- small-/wide-angle X-ray Scattering
- X-ray diffraction
- X-ray total scattering
- X-ray Raman scattering
- resonance inelastic X-ray scattering
- X-ray Compton scattering
- energy materials
- quantum materials
- soft materials
- disordered materials
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