Underlying Methodology for a Thermal Process Monitoring System for Wire and Arc Additive Manufacturing

Baier, Daniel; Weckenmann, Tobias; Wolf, Franz; Wimmer, Andreas; Zaeh, Michael F.

doi:10.3390/jmmp7010010

Open AccessArticle

Underlying Methodology for a Thermal Process Monitoring System for Wire and Arc Additive Manufacturing

by

Daniel Baier

^*

,

Tobias Weckenmann

,

Franz Wolf

,

Andreas Wimmer

and

Michael F. Zaeh

Institute for Machine Tools and Industrial Management, Department of Mechanical Engineering, TUM School of Engineering and Design, Technical University of Munich, Boltzmannstrasse 15, 85748 Garching, Germany

^*

Author to whom correspondence should be addressed.

J. Manuf. Mater. Process. 2023, 7(1), 10; https://doi.org/10.3390/jmmp7010010

Submission received: 1 November 2022 / Revised: 6 December 2022 / Accepted: 23 December 2022 / Published: 28 December 2022

(This article belongs to the Topic Additive Manufacturing: Design, Opportunities, and Applications)

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Abstract

The Wire and Arc Additive Manufacturing (WAAM) process has a high potential for industrial applications in aviation. The interlayer temperatures influence the dimensions and geometric deviations of the part. Monitoring the absolute interlayer temperature values is necessary for quantifying these influences. This paper presents an approach for determining the absolute values of the interlayer temperatures during the process using Ti-6Al-4V. The emissivity and transmittance are determined and calibrated, enabling precise thermographic measuring during the WAAM process. The recorded thermographic data are then compared to signals of thermocouples so that the absolute temperature values can be aligned. The methodology is validated by its transfer to measure the interlayer temperature at different regions of interest. The effect of a heat accumulation using Ti-6Al-4V in WAAM was determined. The methodology enables a reproducible and non-tactile measurement of the interlayer temperature during the WAAM process. The results show that with an interlayer temperature of 200 °C, a heat accumulation occurs within a layer. The heat accumulates in the center of the layer because the free ends of the layer cool down faster than the center of the layer.

Keywords: WAAM; Additive Manufacturing; thermal process monitoring; Ti-6Al-4V

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MDPI and ACS Style

Baier, D.; Weckenmann, T.; Wolf, F.; Wimmer, A.; Zaeh, M.F. Underlying Methodology for a Thermal Process Monitoring System for Wire and Arc Additive Manufacturing. J. Manuf. Mater. Process. 2023, 7, 10. https://doi.org/10.3390/jmmp7010010

AMA Style

Baier D, Weckenmann T, Wolf F, Wimmer A, Zaeh MF. Underlying Methodology for a Thermal Process Monitoring System for Wire and Arc Additive Manufacturing. Journal of Manufacturing and Materials Processing. 2023; 7(1):10. https://doi.org/10.3390/jmmp7010010

Chicago/Turabian Style

Baier, Daniel, Tobias Weckenmann, Franz Wolf, Andreas Wimmer, and Michael F. Zaeh. 2023. "Underlying Methodology for a Thermal Process Monitoring System for Wire and Arc Additive Manufacturing" Journal of Manufacturing and Materials Processing 7, no. 1: 10. https://doi.org/10.3390/jmmp7010010

APA Style

Baier, D., Weckenmann, T., Wolf, F., Wimmer, A., & Zaeh, M. F. (2023). Underlying Methodology for a Thermal Process Monitoring System for Wire and Arc Additive Manufacturing. Journal of Manufacturing and Materials Processing, 7(1), 10. https://doi.org/10.3390/jmmp7010010

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Underlying Methodology for a Thermal Process Monitoring System for Wire and Arc Additive Manufacturing

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