A Systematic Taxonomy and Comparative Analysis of Mixed-Signal Simulation Methods: From Classical SPICE to AI-Enhanced Approaches
Abstract
1. Introduction
- A novel three-axis classification framework organizing mixed-signal simulation methods by abstraction level, solver methodology, and analysis type, providing a structured basis for systematic comparison.
- A comparative evaluation methodology based on five quantitative metrics (accuracy, throughput, capacity, convergence reliability, scalability) applied consistently across all method categories.
- A systematic comparative analysis of thirteen classical method categories and eight AI/ML approaches, yielding evidence-based maturity assessments and industrial readiness evaluations.
- Identification of specific research gaps and industrial deployment barriers through cross-cutting analysis of the method landscape.
2. Proposed Taxonomy and Evaluation Framework
2.1. Three-Axis Classification Framework
2.1.1. Axis 1: Abstraction Level
- Gate level. Timing-annotated gate netlists for digital with transistor-level or behavioral analog descriptions, used where standard-cell timing accuracy is needed [26].
- Register-transfer level (RTL). Digital described in Verilog/VHDL, analog via behavioral models, enabling fast functional verification [8].
- System level. Frameworks such as SystemC-AMS [17] or MATLAB/Simulink (MathWorks) with idealized input–output functions, providing the fastest execution for architectural exploration. MATLAB/Simulink-based co-simulation is primarily suited for preliminary principle verification and algorithm-level exploration; significant discrepancies exist between such system-level models and actual circuit implementations, particularly regarding parasitic effects, device nonlinearities, and layout-dependent phenomena.
2.1.2. Axis 2: Solver Methodology
- FastSPICE. Achieves 10–100× speedup through event-driven evaluation, table-based models, partitioning, and multi-rate integration [15].
- Formal methods. Model checking and theorem proving provide mathematical guarantees over all inputs [28]; extending to analog continuous dynamics remains active research.
- ML surrogates. Neural networks, GNNs, and Gaussian processes provide near-instantaneous predictions but face generalization and accuracy challenges [24].
2.1.3. Axis 3: Analysis Type
- DC operating point determines quiescent bias by setting all time derivatives to zero.
- AC small-signal linearizes about the DC point and computes frequency response.
- Transient solves the full nonlinear DAE in time, capturing large-signal dynamics [9].
- PSS and harmonic balance (HB) exploit periodicity of RF/clocked circuits to find steady-state directly [29].
- Monte Carlo and statistical sample PVT variations to estimate yield [30], with importance sampling and Latin hypercube improving efficiency.
- Noise analysis computes spectral densities from thermal, shot, and flicker sources; transient noise captures time-domain behavior in nonlinear circuits.
2.2. Five-Metric Evaluation Framework
- Accuracy. Fidelity relative to silicon or a SPICE golden reference, quantified as percentage error in key metrics or the normalized root-mean-square error:
- Capacity. Maximum practical circuit size: – transistors for SPICE, – for FastSPICE, and full SoCs through abstraction [15].
- Convergence reliability. Probability of reaching a valid solution without convergence failure, critical for circuits with strong nonlinearities or oscillatory behavior.
- Scalability. Growth rate of computational cost with circuit size. SPICE exhibits to scaling; hierarchical methods aim for linear scaling [9].
2.3. Framework Application Methodology
- 1.
- Architecture exploration: (system-level, co-simulation, transient)—use SystemC-AMS or MATLAB (MathWorks)/Simulink to evaluate candidate architectures, trading accuracy for speed (>10,000× vs. SPICE).
- 2.
- Block-level analog verification: (transistor, SPICE, transient + noise)—use Spectre or HSPICE to verify the comparator and DAC at full accuracy, ensuring noise and mismatch performance meets specifications.
- 3.
- Full-ADC co-simulation: (behavioral + transistor, co-simulation, transient)—use AMS Designer or VCS-AMS with transistor-level analog critical blocks and Verilog-AMS behavioral models for digital logic, balancing capacity and accuracy.
- 4.
- Post-layout signoff: (transistor, FastSPICE, transient + statistical)—use FastSPICE with extracted parasitics for timing closure, and Monte Carlo with importance sampling for yield estimation.
- 5.
- Design optimization (optional): (transistor, ML-surrogate + SPICE, statistical)—apply Bayesian optimization to tune comparator sizing, using GP surrogates for exploration and SPICE for signoff validation.
3. Classical Simulation Methods
3.1. SPICE and Circuit-Level Methods
3.2. FastSPICE and RF Methods
3.3. Statistical Methods
3.4. System-Level and Co-Simulation
4. AI-Enhanced Methods
4.1. Surrogate Models

4.2. ML-Accelerated Simulation
4.3. Intelligent Optimization
4.4. LLMs and Pragmatic Assessment
4.4.1. What Truly Works Today
- Surrogates for exploration: useful for identifying promising design regions with SPICE validation before signoff.
- GNNs for prediction: promising for specific circuit families with topology awareness, though limited generalization.
- LLMs for workflow: genuine productivity gains in code generation, documentation, and tool interfacing.
4.4.2. What Remains Aspirational
4.4.3. Practical Deployment Considerations
5. Systematic Comparison and Analysis
5.1. Method Comparison
5.2. AI/ML Method Comparison
5.3. Industrial Tool Ecosystem
5.4. Cross-Cutting Analysis
6. Discussion
6.1. Implications of the Taxonomy Framework
6.2. Open Challenges
6.3. Future Directions
- Short-term (1–3 years): Standardize open benchmarks and evaluation protocols for AI/ML methods in AMS design [77]; integrate Bayesian optimization into all major commercial tool flows; develop certified uncertainty quantification for ML surrogates.
- Medium-term (3–5 years): Achieve cross-technology transfer learning that generalizes across process nodes; develop automated methodology-selection systems leveraging the proposed taxonomy; create hybrid simulation engines combining SPICE accuracy with ML-accelerated exploration.
- Long-term (5–10 years): Realize digital twin frameworks for IC design with continuous model refinement from silicon data; develop foundation models for circuits pre-trained on large-scale simulation corpora; achieve simulation–measurement convergence through Bayesian data fusion.
6.4. Verification as a Cross-Cutting Concern
7. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
Abbreviations
| AMS | Analog/Mixed-Signal |
| SPICE | Simulation Program with Integrated Circuit Emphasis |
| EDA | Electronic Design Automation |
| MNA | Modified Nodal Analysis |
| MOR | Model Order Reduction |
| ML | Machine Learning |
| DNN | Deep Neural Network |
| GNN | Graph Neural Network |
| BO | Bayesian Optimization |
| RL | Reinforcement Learning |
| LLM | Large Language Model |
| SoC | System-on-Chip |
| RNM | Real Number Modeling |
| PVT | Process, Voltage, Temperature |
References
- Razavi, B. Design of Analog CMOS Integrated Circuits, 2nd ed.; McGraw-Hill Education: New York, NY, USA, 2017. [Google Scholar]
- Alioto, M. Enabling the Internet of Things: From Integrated Circuits to Integrated Systems; Springer: Cham, Switzerland, 2017. [Google Scholar] [CrossRef]
- Hasch, J.; Topak, E.; Schnabel, R.; Zwick, T.; Weigel, R.; Waldschmidt, C. Millimeter-Wave Technology for Automotive Radar Sensors in the 77 GHz Frequency Band. IEEE Trans. Microw. Theory Tech. 2012, 60, 845–860. [Google Scholar] [CrossRef]
- Murmann, B. ADC Performance Survey 1997–2024. 2024. Available online: https://github.com/bmurmann/ADC-survey (accessed on 1 March 2025).
- WSTS. World Semiconductor Trade Statistics (WSTS) Semiconductor Market Forecast. World Semiconductor Trade Statistics. 2024. Available online: https://www.wsts.org/ (accessed on 1 March 2025).
- BSIM Group. BSIM-CMG Technical Manual; University of California: Berkeley, CA, USA, 2017; Available online: https://bsim.berkeley.edu/models/bsimcmg/ (accessed on 1 March 2025).
- Chauhan, Y.S.; Lu, D.; Sriramkumar, V.; Khandelwal, S.; Duarte, J.P.; Paydavosi, N.; Niknejad, A.; Hu, C. FinFET Modeling for IC Simulation and Design: Using the BSIM-CMG Standard Model; Academic Press: San Diego, CA, USA, 2015. [Google Scholar]
- Kundert, K.S.; Zinke, O. The Designer’s Guide to Verilog-AMS; Kluwer Academic Publishers: Boston, MA, USA, 2004. [Google Scholar]
- Pillage, L.T.; Rohrer, R.A.; Visweswariah, C. Electronic Circuit and System Simulation Methods; McGraw-Hill: New York, NY, USA, 1995. [Google Scholar]
- Nagel, L.W.; Pederson, D.O. SPICE (Simulation Program with Integrated Circuit Emphasis); Technical Report ERL-M382; Electronics Research Laboratory, University of California: Berkeley, CA, USA, 1973. [Google Scholar]
- Christen, E.; Bakalar, K. VHDL-AMS—A Hardware Description Language for Analog and Mixed-Signal Applications. IEEE Trans. Circuits Syst. II Analog Digit. Signal Process. 1999, 46, 1263–1272. [Google Scholar] [CrossRef]
- Muñoz, D.; Melikyan, V.; Markosyan, A. Accelerating Mixed-Signal Validation Using Real Number Models. In Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems (ICECS); IEEE: New York City, NY, USA, 2018; pp. 657–660. [Google Scholar]
- Nagel, L.W. SPICE2: A Computer Program to Simulate Semiconductor Circuits; Technical Report ERL-M520; Electronics Research Laboratory, University of California: Berkeley, CA, USA, 1975. [Google Scholar]
- Vladimirescu, A. The SPICE Book; John Wiley & Sons: New York, NY, USA, 1994. [Google Scholar]
- Sui, Y.F.; Bhatt, D.; Bhattacharya, S.; Kao, S. A Unified Event/Level Sensitive Transistor Level Timing Simulator. In Proceedings of the IEEE/ACM International Conference on Computer-Aided Design (ICCAD); IEEE: New York City, NY, USA, 1998; pp. 280–284. [Google Scholar]
- IEEE Std 1800-2012; Standard for SystemVerilog—Unified Hardware Design, Specification, and Verification Language. IEEE: New York City, NY, USA, 2013; Includes provisions for analog and mixed-signal extensions.
- Barnasconi, M.; Einwich, K.; Grimm, C.; Maehne, T.; Vachoux, A. SystemC-AMS: System-Level Modeling of Heterogeneous Systems. IEEE Des. Test Comput. 2012, 29, 78–88. [Google Scholar]
- Odabasioglu, A.; Celik, M.; Pileggi, L.T. PRIMA: Passive Reduced-Order Interconnect Macromodeling Algorithm. IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 1998, 17, 645–654. [Google Scholar] [CrossRef]
- Hakhamaneshi, K.; Nassar, M.; Phielipp, M.; Abbeel, P.; Stojanovic, V. Pretraining Graph Neural Networks for Few-Shot Analog Circuit Modeling and Design. IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 2023, 42, 2163–2176. [Google Scholar] [CrossRef]
- Budak, A.F.; Bhansali, P.; Liu, S.; Sun, N.; Pan, D.Z.; Kashyap, C.V. DNN-Opt: An RL Inspired Optimization for Analog Circuit Sizing Using Deep Neural Networks. In Proceedings of the 58th ACM/IEEE Design Automation Conference (DAC), San Francisco, CA, USA, 5–9 December 2021; pp. 1219–1224. [Google Scholar] [CrossRef]
- Lyu, W.; Yang, F.; Yan, C.; Zhou, D.; Zeng, X. Batch Bayesian Optimization via Multi-Objective Acquisition Ensemble for Automated Analog Circuit Design. In Proceedings of the 35th International Conference on Machine Learning (ICML), Stockholm, Sweden, 10–15 July 2018; pp. 3306–3314. [Google Scholar]
- Wu, H.; He, Z.; Zhang, X.; Yao, X.; Zheng, S.; Zheng, H.; Yu, B. ChatEDA: A Large Language Model Powered Autonomous Agent for EDA. IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 2024, 43, 3583–3596. [Google Scholar] [CrossRef]
- Gielen, G.G.E.; Rutenbar, R.A. Computer-Aided Design of Analog and Mixed-Signal Integrated Circuits. Proc. IEEE 2000, 88, 1825–1852. [Google Scholar] [CrossRef]
- Huang, G.; Hu, J.; He, Y.; Liu, J.; Ma, M.; Shen, Z.; Wu, J.; Xu, Y.; Zhang, H.; Zhong, K.; et al. Machine Learning for Electronic Design Automation: A Survey. ACM Trans. Des. Autom. Electron. Syst. 2021, 26, 1–46. [Google Scholar] [CrossRef]
- Gildenblat, G.; Li, X.; Wu, W.; Wang, H.; Jha, A.; van Langevelde, R.; Smit, G.D.J.; Scholten, A.J.; Klaassen, D.B.M. PSP: An Advanced Surface-Potential-Based MOSFET Model for Circuit Simulation. IEEE Trans. Electron Devices 2006, 53, 1979–1993. [Google Scholar] [CrossRef]
- Rabaey, J.M.; Chandrakasan, A.; Nikolić, B. Digital Integrated Circuits: A Design Perspective, 2nd ed.; Prentice Hall: Upper Saddle River, NJ, USA, 2003. [Google Scholar]
- IEEE. IEEE Standard VHDL Analog and Mixed-Signal Extensions (IEEE Std 1076.1-2007). Defines Continuous-Time and Frequency-Domain Extensions to VHDL. 2007. Available online: https://ieeexplore.ieee.org/document/4384309 (accessed on 1 March 2025).
- Zaki, M.H.; Tahar, S.; Bois, G. Formal Verification of Analog and Mixed-Signal Designs: A Survey. Microelectron. J. 2008, 39, 1395–1404. [Google Scholar] [CrossRef]
- Kundert, K.S. Introduction to RF Simulation and Its Application. IEEE J. Solid State Circuits 1999, 34, 1298–1319. [Google Scholar] [CrossRef]
- Singhee, A.; Rutenbar, R.A. Extreme Statistics in Nanoscale Memory Design; Springer: New York, NY, USA, 2010. [Google Scholar] [CrossRef]
- Ho, C.W.; Ruehli, A.E.; Brennan, P.A. The Modified Nodal Approach to Network Analysis. IEEE Trans. Circuits Syst. 1975, 22, 504–509. [Google Scholar] [CrossRef]
- Quarteroni, A.; Sacco, R.; Saleri, F. Numerical Mathematics, 2nd ed.; Springer: Berlin, Germany, 2007. [Google Scholar] [CrossRef]
- Gear, C.W. Numerical Initial Value Problems in Ordinary Differential Equations; Prentice-Hall: Englewood Cliffs, NJ, USA, 1971. [Google Scholar]
- Xi, X.; Dunga, M.; He, J.; Liu, W.; Cao, K.M.; Jin, X.; Ou, J.J.; Chan, M.; Niknejad, A.M.; Hu, C. BSIM4.3.0 MOSFET Model—User’s Manual; Technical Report; Department of Electrical Engineering and Computer Sciences, University of California: Berkeley, CA, USA, 2004; Available online: https://bsim.berkeley.edu/models/bsim4/ (accessed on 1 March 2025).
- ISO 26262; Road Vehicles–Functional Safety, 2nd Edition. International Organization for Standardization: Geneva, Switzerland, 2018.
- Keiter, E.R.; Aadithya, K.V.; Mei, T.; Russo, T.V.; Schiek, R.L.; Sholander, P.E.; Thornquist, H.K.; Verley, J.C. Xyce Parallel Electronic Simulator: Reference Guide. Technical Report SAND2023-01032. Sandia National Laboratories. 2023. Available online: https://xyce.sandia.gov/ (accessed on 1 March 2025).
- Nenzi, P.; Vogt, H. Ngspice–Open Source Mixed-Mode, Mixed-Level Circuit Simulator. 2024. Available online: https://ngspice.sourceforge.io/ (accessed on 1 March 2025).
- Rizzoli, V.; Mastri, F.; Cecchetti, C.; Lipparini, A. General-Purpose Harmonic Balance Analysis of Nonlinear Microwave Circuits Under Multitone Excitation. IEEE Trans. Microw. Theory Tech. 1988, 36, 1650–1660. [Google Scholar] [CrossRef]
- Aprille, T.J.; Trick, T.N. Steady-State Analysis of Nonlinear Circuits with Periodic Inputs. Proc. IEEE 1972, 60, 108–114. [Google Scholar] [CrossRef]
- Cadence Design Systems, Inc. Spectre Simulation Platform; Cadence Design Systems, Inc.: San Jose, CA, USA, 2023. [Google Scholar]
- Brambilla, A.; Maffezzoni, P. Envelope-Following Method for the Transient Analysis of Electrical Circuits. IEEE Trans. Circuits Syst. I Fundam. Theory Appl. 2000, 47, 999–1008. [Google Scholar] [CrossRef]
- Pelgrom, M.J.M.; Duinmaijer, A.C.J.; Welbers, A.P.G. Matching Properties of MOS Transistors. IEEE J. Solid State Circuits 1989, 24, 1433–1440. [Google Scholar] [CrossRef]
- Kanj, R.; Joshi, R.; Nassif, S. Statistical Yield Estimation and Design of SRAM Cells. IEEE Des. Test Comput. 2006, 23, 493–504. [Google Scholar]
- McKay, M.D.; Beckman, R.J.; Conover, W.J. A Comparison of Three Methods for Selecting Values of Input Variables in the Analysis of Output from a Computer Code. Technometrics 1979, 21, 239–245. [Google Scholar] [CrossRef]
- Niederreiter, H. Random Number Generation and Quasi-Monte Carlo Methods; SIAM: Philadelphia, PA, USA, 1992. [Google Scholar] [CrossRef]
- Kundert, K.S. Challenges in Mixed-Signal Verification. In Proceedings of the IEEE Custom Integrated Circuits Conference (CICC); IEEE: New York City, NY, USA, 2005; pp. 367–374. [Google Scholar]
- Einwich, K.; Grimm, C.; Vachoux, A. SystemC AMS Extensions: Solving the Need for Speed. In Proceedings of the Design, Automation and Test in Europe Conference (DATE); IEEE: New York City, NY, USA, 2011; pp. 1–6. [Google Scholar]
- Kuhn, M.; Becker, B. Mixed-Signal Methodologies for SoC Verification Using Real Number Models. In Proceedings of the Design, Automation and Test in Europe Conference (DATE); IEEE: New York City, NY, USA, 2015; pp. 1574–1579. [Google Scholar]
- Sommer, R.; Kupferschmid, C.; Enge-Rosenblatt, O. Synchronization of Mixed-Signal Simulators. AEU–Int. J. Electron. Commun. 2008, 62, 161–167. [Google Scholar]
- Saleh, R.A.; Antognetti, P. Relaxation-Based Simulation of Mixed-Signal Circuits. In Proceedings of the IEEE/ACM International Conference on Computer-Aided Design (ICCAD); IEEE: New York City, NY, USA, 1990; pp. 486–489. [Google Scholar]
- Cadence Design Systems, Inc. AMS Designer User Guide; Cadence Design Systems, Inc.: San Jose, CA, USA, 2023. [Google Scholar]
- Synopsys, Inc. VCS AMS User Guide; Synopsys, Inc.: Mountain View, CA, USA, 2023. [Google Scholar]
- Siemens EDA. Questa ADMS User Manual; Siemens Digital Industries Software: Wilsonville, OR, USA, 2023. [Google Scholar]
- Antoulas, A.C. Approximation of Large-Scale Dynamical Systems; SIAM: Philadelphia, PA, USA, 2005. [Google Scholar] [CrossRef]
- Freund, R.W. Model Reduction Methods Based on Krylov Subspaces. Acta Numer. 2003, 12, 267–319. [Google Scholar] [CrossRef]
- Rasmussen, C.E.; Williams, C.K.I. Gaussian Processes for Machine Learning; MIT Press: Cambridge, MA, USA, 2006. [Google Scholar]
- He, B.; Zhang, S.; Wang, Y.; Gao, T.; Yang, F.; Yan, C.; Zhou, D.; Bi, Z.; Zeng, X. A Batched Bayesian Optimization Approach for Analog Circuit Synthesis via Multi-Fidelity Modeling. IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 2023, 42, 347–360. [Google Scholar] [CrossRef]
- Gu, T.; Li, W.; Zhao, A.; Bi, Z.; Li, X.; Yang, F.; Yan, C.; Hu, W.; Zhou, D.; Cui, T.; et al. BBGP-sDFO: Batch Bayesian and Gaussian Process Enhanced Subspace Derivative Free Optimization for High-Dimensional Analog Circuit Synthesis. IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 2024, 43, 1126–1139. [Google Scholar] [CrossRef]
- Li, Y.; Lin, Y.; Madhusudan, M.; Sharma, A.; Xu, W.; Sapatnekar, S.S.; Harjani, R.; Hu, J. A Graph Neural Network Framework for Circuit Performance Prediction. In Proceedings of the 59th ACM/IEEE Design Automation Conference (DAC); IEEE: New York City, NY, USA, 2022; pp. 1–6. [Google Scholar]
- Qian, L.; Bi, Z.; Zhou, D.; Zeng, X. Automated Technology Migration Methodology for Mixed-Signal Circuit Based on Multistart Optimization Framework. IEEE Trans. Very Large Scale Integr. (VLSI) Syst. 2015, 23, 2595–2605. [Google Scholar] [CrossRef]
- Sun, H.; Bi, Z.; Jiang, W.; Lu, Y.; Yan, C.; Yang, F.; Hu, W.; Wang, S.G.; Zhou, D.; Zeng, X. EVDMARL: Efficient Value Decomposition-based Multi-Agent Reinforcement Learning with Domain-Randomization for Complex Analog Circuit Design Migration. In Proceedings of the 61st ACM/IEEE Design Automation Conference (DAC); IEEE: New York City, NY, USA, 2024; pp. 1–6. [Google Scholar] [CrossRef]
- Chen, R.T.Q.; Rubanova, Y.; Bettencourt, J.; Duvenaud, D. Neural Ordinary Differential Equations. Proc. Adv. Neural Inf. Process. Syst. (NeurIPS) 2018, 31, 6571–6583. [Google Scholar] [CrossRef]
- Raissi, M.; Perdikaris, P.; Karniadakis, G.E. Physics-Informed Neural Networks: A Deep Learning Framework for Solving Forward and Inverse Problems Involving Nonlinear Partial Differential Equations. J. Comput. Phys. 2019, 378, 686–707. [Google Scholar] [CrossRef]
- Shahriari, B.; Swersky, K.; Wang, Z.; Adams, R.P.; de Freitas, N. Taking the Human Out of the Loop: A Review of Bayesian Optimization. Proc. IEEE 2016, 104, 148–175. [Google Scholar] [CrossRef]
- Zhao, X.; Bi, Z.; Yan, C.; Yang, F.; Lu, Y.; Zhou, D.; Zeng, X. Asynchronous Batch Constrained Multi-Objective Bayesian Optimization for Analog Circuit Sizing. In Proceedings of the 29th Asia and South Pacific Design Automation Conference (ASP-DAC), Incheon, Republic of Korea, 22–25 January 2024; pp. 1–6. [Google Scholar] [CrossRef]
- Zhao, A.; Wang, X.; Lin, Z.; Bi, Z.; Li, X.; Yan, C.; Yang, F.; Shang, L.; Zhou, D.; Zeng, X. cVTS: A Constrained Voronoi Tree Search Method for High Dimensional Analog Circuit Synthesis. In Proceedings of the 60th ACM/IEEE Design Automation Conference (DAC), San Francisco, CA, USA, 9–13 July 2023; pp. 1–6. [Google Scholar] [CrossRef]
- Gu, T.; Wang, J.; Bi, Z.; Yan, C.; Yang, F.; Qin, Y.; Cui, T.; Zeng, X. tSS-BO: Scalable Bayesian Optimization for Analog Circuit Sizing via Truncated Subspace Sampling. In Proceedings of the Design, Automation and Test in Europe Conference (DATE), Valencia, Spain, 25–27 March 2024; pp. 1–6. [Google Scholar] [CrossRef]
- Zhao, A.; Gu, T.; Bi, Z.; Yang, F.; Yan, C.; Zeng, X.; Lin, Z.; Hu, W.; Zhou, D. D3PBO: Dynamic Domain Decomposition based Parallel Bayesian Optimization for Large-scale Analog Circuit Sizing. ACM Trans. Des. Autom. Electron. Syst. 2024, 29, 1–25. [Google Scholar] [CrossRef]
- Li, W.; Meng, Y.; Lyu, R.; Yan, C.; Zhu, K.; Bi, Z.; Zhou, D.; Zeng, X. MARIO: A Superadditive Multi-Algorithm Interworking Optimization Framework for Analog Circuit Sizing. In Proceedings of the 62nd ACM/IEEE Design Automation Conference (DAC), San Francisco, CA, USA, 22–25 June 2025; pp. 1–7. [Google Scholar] [CrossRef]
- Gu, T.; Lyu, R.; Bi, Z.; Yan, C.; Yang, F.; Zhou, D.; Cui, T.; Liu, X.; Zhang, Z.; Zeng, X. HiMOSS: A Novel High-Dimensional Multi-Objective Optimization Method via Adaptive Gradient-Based Subspace Sampling for Analog Circuit Sizing. In Proceedings of the 61st ACM/IEEE Design Automation Conference (DAC), San Francisco, CA, USA, 23–27 June 2024; pp. 1–6. [Google Scholar] [CrossRef]
- Wang, H.; Wang, K.; Yang, J.; Shen, L.; Sun, N.; Lee, H.S.; Han, S. GCN-RL Circuit Designer: Transferable Transistor Sizing with Graph Neural Networks and Reinforcement Learning. In Proceedings of the 57th ACM/IEEE Design Automation Conference (DAC), San Francisco, CA, USA, 20–24 July 2020; pp. 1–6. [Google Scholar] [CrossRef]
- Settaluri, K.; Haj-Ali, A.; Huang, Q.; Hakhamaneshi, K.; Nikolic, B. AutoCkt: Deep Reinforcement Learning of Analog Circuit Designs. In Proceedings of the Design, Automation and Test in Europe Conference (DATE), Grenoble, France, 9–13 March 2020; pp. 490–495. [Google Scholar] [CrossRef]
- Bao, J.; Zhang, J.; Huang, Z.; Feng, X.; Bi, Z.; Zeng, X.; Lu, Y. Multiagent Based Reinforcement Learning (MA-RL): An Automated Designer for Complex Analog Circuits. IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 2024, 43, 1437–1450. [Google Scholar] [CrossRef]
- Feng, X.; Xu, Y.; Huang, Z.; Xu, W.; Bi, Z.; Yang, F.; Zeng, X.; Lu, Y. Hierarchical Integration of Reinforcement Learning and Optimization Algorithms for Time-Efficient Design Automation of Complex Analog Circuit. ACM Trans. Des. Autom. Electron. Syst. 2025, 30, 1–22. [Google Scholar] [CrossRef]
- Zhao, A.; Lyu, R.; Zhao, X.; Bi, Z.; Yang, F.; Yan, C.; Zhou, D.; Su, Y.; Zeng, X. VTSMOC: An Efficient Voronoi Tree Search Boosted Multi-objective Bayesian Optimization with Constraints for High-dimensional Analog Circuit Synthesis. IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 2024, 43, 4297–4310. [Google Scholar] [CrossRef]
- Zhao, X.; Gao, T.; Wu, Z.; Bi, Z.; Yan, C.; Yang, F.; Wang, S.G.; Zhou, D.; Zeng, X. APPLE-DSE: Asynchronous Parallel Pareto Set Learning for Microarchitecture Design Space Exploration. IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 2024, 43, 3841–3854. [Google Scholar] [CrossRef]
- Li, J.; Zhi, H.; Lyu, R.; Li, W.; Bi, Z.; Zhu, K.; Zeng, Y.; Shan, W.; Yan, C.; Yang, F.; et al. AnalogGym: An Open and Practical Testing Suite for Analog Circuit Synthesis. In Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design (ICCAD), New York, NY, USA, 27–31 October 2024; pp. 1–9. [Google Scholar] [CrossRef]
- Shen, J.; Yang, F.; Shang, L.; Yan, C.; Bi, Z.; Zhou, D.; Zeng, X. ATOM: An Automatic Topology Synthesis Framework for Operational Amplifiers. IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 2024, 43, 2092–2105. [Google Scholar] [CrossRef]
- Blocklove, J.; Garg, S.; Karri, R.; Pearce, H. Chip-Chat: Challenges and Opportunities in Conversational Hardware Design. In Proceedings of the 5th ACM/IEEE Workshop on Machine Learning for CAD (MLCAD), Snowbird, UT, USA, 10–13 September 2023; pp. 1–6. [Google Scholar] [CrossRef]
- Liu, S.; Fang, W.; Lu, Y.; Wang, J.; Zhang, Q.; Zhang, H.; Xie, Z. RTLCoder: Fully Open-Source and Efficient LLM-Assisted RTL Code Generation Technique. IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 2024, 43, 3981–3993. [Google Scholar] [CrossRef]
- Shen, J.; Chen, Z.; Zhuang, J.; Huang, J.; Yang, F.; Shang, L.; Bi, Z.; Yan, C.; Zhou, D.; Zeng, X. Atelier: An Automated Analog Circuit Design Framework via Multiple Large Language Model-based Agents. IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 2025, 45, 31–44. [Google Scholar] [CrossRef]
- Gao, N.; Liu, Y.; Zhang, Q.; Li, X.; Jin, S. Let RFF do the talking: Large language model enabled lightweight RFFI for 6G edge intelligence. Sci. China Inf. Sci. 2025, 68, 170308. [Google Scholar] [CrossRef]
- Wei, J.; Liang, F.; Feng, H.; Ran, L. Condition Monitoring of Discrete Power Devices: A Data-Driven Approach with Stress Quantification and Mold Temperature Sensing. IEEE J. Emerg. Sel. Top. Power Electron. 2024, 12, 2569–2579. [Google Scholar] [CrossRef]
- Siemens EDA. Siemens Solido Design Environment. Product Documentation. ML-Based Variation-Aware Design and Characterization. 2024. Available online: https://eda.sw.siemens.com/en-US/ic/solido/ (accessed on 1 March 2025).
- Synopsys, Inc. Synopsys DSO.ai–Autonomous Chip Design. Product Documentation. AI-Driven Design Space Optimization. 2024. Available online: https://www.synopsys.com/ai/ai-powered-eda/dso-ai.html (accessed on 1 March 2025).
- Cadence Design Systems, Inc. Cadence Cerebrus Intelligent Chip Explorer. Product Documentation. AI-Driven Design Optimization Platform. 2024. Available online: https://www.cadence.com/en_US/home/tools/digital-design-and-signoff/soc-implementation-and-floorplanning/cerebrus-intelligent-chip-explorer.html (accessed on 1 March 2025).
- Barraud, S.; Previtali, B.; Vizioz, C.; Hartmann, J.M.; Sturm, J.; Widiez, J.; Vinet, M. Performance and Design Considerations for Gate-All-Around Stacked-Nanowires FETs. In Proceedings of the 2017 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 2–6 December 2017; pp. 29.2.1–29.2.4. [Google Scholar] [CrossRef]
- Stow, D.; Akgun, I.; Fan, Y.; Mulay, G.; Xie, Y. Cost and Thermal Analysis of High-Performance Chiplet-Based Multi-Chip Modules. In Proceedings of the IEEE Computer Society Annual Symposium on VLSI (ISVLSI), San Jose, CA, USA, 11–13 July 2017; pp. 233–240. [Google Scholar]
- Cadence Design Systems, Inc. Cadence CloudBurst Platform for Hybrid Cloud. Product Documentation. Cloud-Native EDA Platform. 2024. Available online: https://www.cadence.com/en_US/home/solutions/cadence-cloud.html (accessed on 1 June 2025).
- Synopsys, Inc. Synopsys Cloud. Product Documentation. Cloud-Based EDA Solution. 2024. Available online: https://www.synopsys.com/cloud.html (accessed on 1 June 2025).


| Simulator | Vendor | License | Parallelism | Primary Strength |
|---|---|---|---|---|
| HSPICE | Synopsys | Commercial | Multi-thread | Accuracy, library characterization |
| Spectre | Cadence | Commercial | APS multi-core | Virtuoso integration, RF analyses |
| ELDO | Siemens EDA | Commercial | Multi-thread | Automotive, reliability simulation |
| Xyce | Sandia Labs | Open-source (GPLv3) | MPI distributed | HPC scalability |
| ngspice | Community | Open-source (BSD) | Limited | Education, open EDA flows |
| Abstraction Level | Typical Speedup | Accuracy | Use Case |
|---|---|---|---|
| Transistor level (SPICE) | 1× (reference) | Golden reference | Block-level signoff |
| Verilog-AMS behavioral | 100–1000× | Functional, first-order | Mixed-signal co-simulation |
| Real number model (RNM) | 1000–10,000× | Signal-flow only | SoC-level verification |
| Method Category | Accuracy | Speed | Capacity | Maturity | Best Use Case |
|---|---|---|---|---|---|
| SPICE | Gold standard | Slow (hours–days) | 10K–50K transistors | Mature (50+ yrs) | Analog block signoff |
| FastSPICE | 95–99% of SPICE | 10–100× faster | Up to ∼10M transistors | Mature (25+ yrs) | Full-chip post-layout |
| RF/PSS | Gold standard (periodic) | Minutes–hours | ∼10K transistors | Mature (30+ yrs) | RF block characterization |
| Behavioral (Verilog-AMS) | Model-dependent | 100–1000× vs. SPICE | ∼1M+ blocks | Mature (20+ yrs) | System-level verification |
| SystemC-AMS | Low–moderate | Very fast | System level | Mature (15+ yrs) | Virtual prototyping |
| RNM/wreal | Low (signal-flow) | 10–100× vs. behavioral | Full SoC | Mature (10+ yrs) | SoC-level validation |
| Co-simulation | Composite | Moderate overhead | Depends on partition | Mature (20+ yrs) | Mixed-signal SoC |
| MOR | 95–99% | Fast | Millions→100s of nodes | Mature (25+ yrs) | Parasitic reduction |
| Formal verification | Exact (modeled props.) | Variable | Small blocks only | Research | Critical property checking |
| ML surrogate | 85–95% | Very fast (ms) | Flexible | Early | Design exploration |
| ML-accelerated sim. | 90–99% | 10–1000× | Research-scale | Research | Simulation acceleration |
| BO/RL optimization | N/A (optimizer) | Efficient (fewer evals) | Medium | Maturing | Analog sizing/tuning |
| LLM for EDA | N/A (assistant) | N/A | N/A | Very early | Workflow assistance |
| ML Method | Application | Key Advantage | Key Limitation | Maturity |
|---|---|---|---|---|
| Gaussian Process | Surrogate modeling, BO | Uncertainty quantification | scaling | Moderate |
| DNN | Performance prediction | Large model capacity | No uncertainty; data hungry | Moderate |
| GNN | Topology-aware prediction | Structural generalization | Limited to graph-structured data | Early |
| Neural ODE | Transient simulation | Continuous dynamics | Stability concerns | Research |
| PINN | Physics-constrained prediction | Physics consistency | Training difficulty | Research |
| RL (DQN/PPO) | Circuit sizing | Sequential decision-making | Sample inefficient | Early |
| Transfer learning | Cross-technology prediction | Reduced data needs | Domain gap | Early |
| LLM | Code generation, spec. parsing | Natural language interface | No circuit physics | Very early |
| Tool | Vendor | Type | Parallel | Open Src | AI | Key Strength |
|---|---|---|---|---|---|---|
| Spectre/APS/XPS | Cadence | SPICE | Yes | No | Cerebrus | RF/analog accuracy |
| AMS Designer | Cadence | Co-sim | Yes | No | No | Spectre + Xcelium |
| HSPICE | Synopsys | SPICE | Yes | No | DSO.ai | Signoff reference |
| CustomSim | Synopsys | FastSPICE | Yes | No | No | Large-circuit capacity |
| VCS-AMS | Synopsys | Co-sim | Yes | No | No | VCS + CustomSim |
| PrimeSim | Synopsys | Unified | Yes | No | Yes | Multi-engine |
| ELDO | Siemens | SPICE | Yes | No | No | Automotive reliability |
| Questa ADMS | Siemens | Co-sim | Yes | No | No | Verification flow |
| Solido | Siemens | Statistical | Yes | No | ML | Variation analysis |
| ngspice | Community | SPICE | No | Yes | No | Education/research |
| Xyce | Sandia | SPICE | MPI | Yes | No | HPC scalability |
| Method Family | Best-Use Scenario | Main Limitation |
|---|---|---|
| SPICE | Analog block signoff, golden reference | Capacity (<50K transistors), runtime |
| FastSPICE | Post-layout full-chip verification | Accuracy trade-off (1–5% vs. SPICE) |
| RF/PSS/HB | RF block characterization, phase noise | Limited to periodic/quasi-periodic signals |
| Behavioral (Verilog-AMS) | Mixed-signal system co-simulation | Model fidelity depends on manual abstraction |
| RNM/wreal | SoC-level functional validation | No analog physics (noise, loading, distortion) |
| Co-simulation | Full mixed-signal SoC verification | Synchronization overhead, interface complexity |
| MOR | Parasitic reduction for SPICE inclusion | Linear systems only; nonlinear MOR immature |
| Bayesian optimization | Analog circuit sizing with few evaluations | Scales poorly beyond ∼50 parameters |
| ML surrogates | Design space exploration, trade-off analysis | 5–15% error; unsuitable for signoff |
| LLM-based tools | HDL code generation, workflow automation | No circuit physics understanding |
Disclaimer/Publisher’s Note: The statements, opinions and data contained in all publications are solely those of the individual author(s) and contributor(s) and not of MDPI and/or the editor(s). MDPI and/or the editor(s) disclaim responsibility for any injury to people or property resulting from any ideas, methods, instructions or products referred to in the content. |
© 2026 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license.
Share and Cite
Yu, J.; Zhu, H.; Yuan, J.; Jiang, L. A Systematic Taxonomy and Comparative Analysis of Mixed-Signal Simulation Methods: From Classical SPICE to AI-Enhanced Approaches. Electronics 2026, 15, 1687. https://doi.org/10.3390/electronics15081687
Yu J, Zhu H, Yuan J, Jiang L. A Systematic Taxonomy and Comparative Analysis of Mixed-Signal Simulation Methods: From Classical SPICE to AI-Enhanced Approaches. Electronics. 2026; 15(8):1687. https://doi.org/10.3390/electronics15081687
Chicago/Turabian StyleYu, Jian, Hairui Zhu, Jiawen Yuan, and Lei Jiang. 2026. "A Systematic Taxonomy and Comparative Analysis of Mixed-Signal Simulation Methods: From Classical SPICE to AI-Enhanced Approaches" Electronics 15, no. 8: 1687. https://doi.org/10.3390/electronics15081687
APA StyleYu, J., Zhu, H., Yuan, J., & Jiang, L. (2026). A Systematic Taxonomy and Comparative Analysis of Mixed-Signal Simulation Methods: From Classical SPICE to AI-Enhanced Approaches. Electronics, 15(8), 1687. https://doi.org/10.3390/electronics15081687

