- Article
Extreme Path Delay Estimation of Critical Paths in Within-Die Process Fluctuations Using Multi-Parameter Distributions
- Miikka Runolinna,
- Matthew Turnquist,
- Jukka Teittinen,
- Pauliina Ilmonen and
- Lauri Koskinen
Two multi-parameter distributions, namely the Pearson type IV and metalog distributions, are discussed and suggested as alternatives to the normal distribution for modelling path delay data that determines the maximum clock frequency (FMAX) of a micr...

