Order Article Reprints

Zhang J, Fu X, Zhou S, Ning H, Wang Y, Guo D, Cai W, Liang Z, Yao R, Peng J. The Effect of Zirconium Doping on Solution-Processed Indium Oxide Thin Films Measured by a Novel Nondestructive Testing Method (Microwave Photoconductivity Decay). Coatings. 2019; 9(7):426. https://doi.org/10.3390/coatings9070426

Zhang, Jingying, Xiao Fu, Shangxiong Zhou, Honglong Ning, Yiping Wang, Dong Guo, Wei Cai, Zhihao Liang, Rihui Yao, and Junbiao Peng. 2019. "The Effect of Zirconium Doping on Solution-Processed Indium Oxide Thin Films Measured by a Novel Nondestructive Testing Method (Microwave Photoconductivity Decay)" Coatings 9, no. 7: 426. https://doi.org/10.3390/coatings9070426

Zhang, J., Fu, X., Zhou, S., Ning, H., Wang, Y., Guo, D., Cai, W., Liang, Z., Yao, R., & Peng, J. (2019). The Effect of Zirconium Doping on Solution-Processed Indium Oxide Thin Films Measured by a Novel Nondestructive Testing Method (Microwave Photoconductivity Decay). Coatings, 9(7), 426. https://doi.org/10.3390/coatings9070426