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Journal: CoatingsVolume: 9Number: 426
Article: The Effect of Zirconium Doping on Solution-Processed Indium Oxide Thin Films Measured by a Novel Nondestructive Testing Method (Microwave Photoconductivity Decay)
  • Authors:
  • Jingying Zhang 1,
  • Xiao Fu 1 and
  • Junbiao Peng 1
  • et al.
Link: https://www.mdpi.com/2079-6412/9/7/426

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