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Journal: Nanomaterials, 2021
Volume: 11
Number: 820

Article: Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy
Authors: by François Piquemal, José Morán-Meza, Alexandra Delvallée, Damien Richert and Khaled Kaja
Link: https://www.mdpi.com/2079-4991/11/3/820

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