Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy
Piquemal, F.; Morán-Meza, J.; Delvallée, A.; Richert, D.; Kaja, K. Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy. Nanomaterials 2021, 11, 820. https://doi.org/10.3390/nano11030820
Piquemal F, Morán-Meza J, Delvallée A, Richert D, Kaja K. Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy. Nanomaterials. 2021; 11(3):820. https://doi.org/10.3390/nano11030820
Chicago/Turabian StylePiquemal, François, José Morán-Meza, Alexandra Delvallée, Damien Richert, and Khaled Kaja. 2021. "Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy" Nanomaterials 11, no. 3: 820. https://doi.org/10.3390/nano11030820