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Journal: Appl. Sci., 2025
Volume: 15
Number: 423
Article:
Fourier Ptychographic Microscopy with Optical Aberration Correction and Phase Unwrapping Based on Semi-Supervised Learning
Authors:
by
Xuhui Zhou, Haiping Tong, Er Ouyang, Lin Zhao and Hui Fang
Link:
https://www.mdpi.com/2076-3417/15/1/423
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