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Journal: Crystals, 2025
Volume: 15
Number: 798

Article: Negative Capacitance Effect at Interface Between Si Wafers with Undulating Surfaces
Authors: by Hikaru Yasunaga, Kota Yano, Yuki Tanioka, Sota Fujimoto, Shigeru Kanemitsu and Yong Sun
Link: https://www.mdpi.com/2073-4352/15/9/798

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