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Journal: Micromachines, 2018
Volume: 9
Number: 659
Article:
3D Numerical Simulation of a Z Gate Layout MOSFET for Radiation Tolerance
Authors:
by
Ying Wang, Chan Shan, Wei Piao, Xing-ji Li, Jian-qun Yang, Fei Cao and Cheng-hao Yu
Link:
https://www.mdpi.com/2072-666X/9/12/659
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