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Journal: Micromachines, 2018
Volume: 9
Number: 659

Article: 3D Numerical Simulation of a Z Gate Layout MOSFET for Radiation Tolerance
Authors: by Ying Wang, Chan Shan, Wei Piao, Xing-ji Li, Jian-qun Yang, Fei Cao and Cheng-hao Yu
Link: https://www.mdpi.com/2072-666X/9/12/659

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