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Article

Revisiting the Dependence of Electrical Resistivity on Cu-Rich Precipitates in an Aged Fe-Cu Model Alloy: A Microstructure-Based Prediction Model

by
Shengjun Xia
1,2,
Menglin Gao
1,
Xing Hu
1,
Chunfa Huang
1,
Shuaiheng Liang
1,
Wenlu Zhang
1 and
Qiulin Li
1,*
1
Shenzhen International Graduate School, Tsinghua University, Shenzhen 518055, China
2
School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
*
Author to whom correspondence should be addressed.
Materials 2025, 18(4), 752; https://doi.org/10.3390/ma18040752
Submission received: 6 January 2025 / Revised: 28 January 2025 / Accepted: 6 February 2025 / Published: 8 February 2025

Abstract

Nanoscale Cu-rich precipitates (CRPs) play a crucial role in the irradiation embrittlement of reactor pressure vessels (RPVs), and binary Fe-Cu alloys serve as practical models to study the evolution of these precipitates. This study investigates the electrical resistivity of an Fe-1.17 wt.% Cu model alloy aged at 450 °C to enhance the understanding of electrical measurements for the non-destructive assessment of RPV irradiation embrittlement. Multi-level characterization methods were used to obtain quantitative data on multi-scale microstructures, including precipitates, dislocations, and grains. The formation and growth of CRPs were found to align closely with the Johnson–Mehl–Avrami model, and the variation in electrical resistivity showed a strong correlation with the evolution of the microstructure. Combined with detailed quantitative microstructure evolution analysis, an electrical resistivity prediction model that considers microstructural mechanisms has been developed. This model can accurately show the effect of CRPs on resistivity and can potentially be extended to RPV steels with other solute-rich precipitates, with a maximum absolute percentage error not exceeding 5%. These results provide a robust basis for the non-destructive and in-service evaluation of RPV irradiation embrittlement using electrical resistivity.
Keywords: Cu-rich precipitates; RPV embrittlement; electrical resistivity; prediction model; non-destructive evaluation Cu-rich precipitates; RPV embrittlement; electrical resistivity; prediction model; non-destructive evaluation

Share and Cite

MDPI and ACS Style

Xia, S.; Gao, M.; Hu, X.; Huang, C.; Liang, S.; Zhang, W.; Li, Q. Revisiting the Dependence of Electrical Resistivity on Cu-Rich Precipitates in an Aged Fe-Cu Model Alloy: A Microstructure-Based Prediction Model. Materials 2025, 18, 752. https://doi.org/10.3390/ma18040752

AMA Style

Xia S, Gao M, Hu X, Huang C, Liang S, Zhang W, Li Q. Revisiting the Dependence of Electrical Resistivity on Cu-Rich Precipitates in an Aged Fe-Cu Model Alloy: A Microstructure-Based Prediction Model. Materials. 2025; 18(4):752. https://doi.org/10.3390/ma18040752

Chicago/Turabian Style

Xia, Shengjun, Menglin Gao, Xing Hu, Chunfa Huang, Shuaiheng Liang, Wenlu Zhang, and Qiulin Li. 2025. "Revisiting the Dependence of Electrical Resistivity on Cu-Rich Precipitates in an Aged Fe-Cu Model Alloy: A Microstructure-Based Prediction Model" Materials 18, no. 4: 752. https://doi.org/10.3390/ma18040752

APA Style

Xia, S., Gao, M., Hu, X., Huang, C., Liang, S., Zhang, W., & Li, Q. (2025). Revisiting the Dependence of Electrical Resistivity on Cu-Rich Precipitates in an Aged Fe-Cu Model Alloy: A Microstructure-Based Prediction Model. Materials, 18(4), 752. https://doi.org/10.3390/ma18040752

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