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Journal: Energies, 2025
Volume: 18
Number: 6083
Article:
Conducted Common-Mode Electromagnetic Interference Analysis of Gate Drivers for High-Voltage SiC Devices
Authors:
by
Kai Xiao, Haibo Tang, Zhihong Cai, Yansheng Zou and Jianyu Pan
Link:
https://www.mdpi.com/1996-1073/18/23/6083
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