Article Versions Notes

Yoo D, Jang Y, Kim Y, Shin J, Lee K, Park S-Y, Shin S, Lee H, Kim S, Park J, et al. Automotive 2.1 μm Full-Depth Deep Trench Isolation CMOS Image Sensor with a 120 dB Single-Exposure Dynamic Range. Sensors. 2023; 23(22):9150. https://doi.org/10.3390/s23229150

Yoo, Dongsuk, Youngtae Jang, Youngchan Kim, Jihun Shin, Kangsun Lee, Seok-Yong Park, Seungho Shin, Hongsuk Lee, Seojoo Kim, Joongseok Park, and et al. 2023. "Automotive 2.1 μm Full-Depth Deep Trench Isolation CMOS Image Sensor with a 120 dB Single-Exposure Dynamic Range" Sensors 23, no. 22: 9150. https://doi.org/10.3390/s23229150

Yoo, D., Jang, Y., Kim, Y., Shin, J., Lee, K., Park, S.-Y., Shin, S., Lee, H., Kim, S., Park, J., Park, C., Lim, M., Bae, H., Park, S., Jung, M., Kim, S., Choi, S., Kim, S., Heo, J., ... Ahn, J. (2023). Automotive 2.1 μm Full-Depth Deep Trench Isolation CMOS Image Sensor with a 120 dB Single-Exposure Dynamic Range. Sensors, 23(22), 9150. https://doi.org/10.3390/s23229150