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Journal: Sensors, 2022
Volume: 22
Number: 9400

Article: Defect Detection of MEMS Based on Data Augmentation, WGAN-DIV-DC, and a YOLOv5 Model
Authors: by Zhenman Shi, Mei Sang, Yaokang Huang, Lun Xing and Tiegen Liu
Link: https://www.mdpi.com/1424-8220/22/23/9400

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