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Shu Y, Mukherjee S, Chang T, Gilmore A, Tringe JW, Stobbe DM, Loh KJ. Multi-Defect Detection in Additively Manufactured Lattice Structures Using 3D Electrical Resistance Tomography. Sensors. 2022; 22(23):9167. https://doi.org/10.3390/s22239167

Shu, Yening, Saptarshi Mukherjee, Tammy Chang, Abigail Gilmore, Joseph W. Tringe, David M. Stobbe, and Kenneth J. Loh. 2022. "Multi-Defect Detection in Additively Manufactured Lattice Structures Using 3D Electrical Resistance Tomography" Sensors 22, no. 23: 9167. https://doi.org/10.3390/s22239167

Shu, Y., Mukherjee, S., Chang, T., Gilmore, A., Tringe, J. W., Stobbe, D. M., & Loh, K. J. (2022). Multi-Defect Detection in Additively Manufactured Lattice Structures Using 3D Electrical Resistance Tomography. Sensors, 22(23), 9167. https://doi.org/10.3390/s22239167