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Open AccessArticle

An Electron Beam Profile Instrument Based on FBGs

1
National Institute Laser, Plasma and Radiation Physics, 409 Atomiştilor St., Măgurele, RO-077125, Romania
2
Apel Laser, 15 Vintila Mihăilescu St., Bucharest, RO-060394, Romania
3
Leibniz Institute of Photonic Technology, Albert Einstein Str. 9, Jena 07745, Germany
*
Author to whom correspondence should be addressed.
Sensors 2014, 14(9), 15786-15801; https://doi.org/10.3390/s140915786
Received: 18 June 2014 / Revised: 30 July 2014 / Accepted: 14 August 2014 / Published: 25 August 2014
(This article belongs to the Section Physical Sensors)
Along with the dose rate and the total irradiation dose measurements, the knowledge of the beam localization and the beam profile/energy distribution in the beam are parameters of interest for charged particle accelerator installations when they are used in scientific investigations, industrial applications or medical treatments. The transverse profile of the beam, its position, its centroid location, and its focus or flatness depend on the instrument operating conditions or on the beam exit setup. Proof-of-concept of a new type of charged particle beam diagnostics based on fiber Bragg gratings (FBGs) was demonstrated. Its operating principle relies on the measurement of the peak wavelength changes for an array of FBG sensors as function of the temperature following the exposure to an electron beam. Periodically, the sensor irradiation is stopped and the FBG are force cooled to a reference temperature with which the temperature influencing each sensor during beam exposure is compared. Commercially available FBGs, and FBGs written in radiation resistant optical fibers, were tested under electron beam irradiation in order to study their possible use in this application. View Full-Text
Keywords: fiber Bragg grating; electron beam; on-line beam profilometry; radiation-hardened optical fiber fiber Bragg grating; electron beam; on-line beam profilometry; radiation-hardened optical fiber
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MDPI and ACS Style

Sporea, D.; Stăncălie, A.; Becherescu, N.; Becker, M.; Rothhardt, M. An Electron Beam Profile Instrument Based on FBGs. Sensors 2014, 14, 15786-15801.

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