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Advances in Microelectronics and Semiconductor Engineering

Topic Information

Keywords

  • new materials
  • integration processes
  • device architectures
  • physical characterization and metrology
  • electrical characterization and reliability
  • CMOS
  • memories
  • cryogenic electronics
  • beyond CMOS
  • 3D integration
Graphical abstract

Participating Journals

154 Articles
Launched in 2020
-Impact Factor
5.9CiteScore
19 DaysSubmission to First Decision
5 DaysAcceptance to Publication
-Highest JCR Category Ranking
94,679 Articles
Launched in 2011
2.9Impact Factor
6.1CiteScore
15 DaysSubmission to First Decision
3 DaysAcceptance to Publication
Q2Highest JCR Category Ranking
143 Articles
Launched in 2022
-Impact Factor
2.8CiteScore
20 DaysSubmission to First Decision
5 DaysAcceptance to Publication
-Highest JCR Category Ranking
32,355 Articles
Launched in 2012
2.9Impact Factor
7.0CiteScore
15 DaysSubmission to First Decision
3 DaysAcceptance to Publication
Q2Highest JCR Category Ranking
1,023 Articles
Launched in 2016
2.4Impact Factor
5.7CiteScore
18 DaysSubmission to First Decision
4 DaysAcceptance to Publication
Q2Highest JCR Category Ranking
58,781 Articles
Launched in 2008
3.7Impact Factor
7.0CiteScore
14 DaysSubmission to First Decision
4 DaysAcceptance to Publication
Q2Highest JCR Category Ranking
2,482 Articles
Launched in 2013
5.2Impact Factor
6.7CiteScore
17 DaysSubmission to First Decision
4 DaysAcceptance to Publication
Q1Highest JCR Category Ranking

Published Papers