Instrument and Measurement

Dear Colleagues,

Instrument and measurement represent the foundation to measure, acquire, and monitor physical phenomena in the electrical and electronics fields. At present, new technologies and solutions developed in recent times, especially for integrated and advanced sensors, are expected to give new perspectives and introducing new instruments in this leading field, requiring at the same time new characterization analyses in order to guarantee precise and accurate measurement. This Topical Collection aims to invite contributors to present their novel achievements in all areas of measurement and instrument science. The topics of interest include but are not limited to:

• Measurement fundamentals;
• Development of instruments and measurement systems;
• Signal processing techniques;
• DSP-based measurement systems;
• Sensors and smart sensors;
• Metrology fundamentals;
• New advanced techniques in measurement science;
• Artificial intelligence for instrumentation and measurement;
• Measurement instruments;
• Data processing and fusion algorithms;
• Distributed measurement systems;
• Sensors networks.

Dr. Marco Carratù
Collection Editor

Manuscript Submission Information

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